Inventor

HAINDS CURTIS C

US3 patents

⚠️ This page may combine multiple inventors who share the name “HAINDS CURTIS C”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

LSI LOGIC CORP

2 patents

US6288454B1Sep 11, 2001

Semiconductor wafer having a layer-to-layer alignment mark and method for fabricating the same

LSI LOGIC CORP216 citations97

US6136662AOct 24, 2000

Semiconductor wafer having a layer-to-layer alignment mark and method for fabricating the same

LSI LOGIC CORP39 citations91

CREDENCE SYSTEMS CORP

1 patent

US6594604B2Jul 15, 2003

S-parameter measurement system for wideband non-linear networks

CREDENCE SYSTEMS CORP32 citations87