Inventor

GRIEF MALCOLM

US25 patents

⚠️ This page may combine multiple inventors who share the name “GRIEF MALCOLM”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

GRIEF MALCOLM

MICRON TECHNOLOGY INC

Engagement probe having a grouping of projecting apexes for engaging a conductive pad

Testing apparatus for engaging electrically conductive test pads on a semiconductor substrate having integrated circuitry for operability testing thereof

Method for chemical planarization (CMP) of a semiconductor wafer to provide a planar surface free of microscratches

Engagement probe and apparatuses configured to engage a conductive pad

Method to reduce the reflectivity of a semi-conductor metallic surface

Methods of forming apparatuses and a method of engaging electrically conductive test pads on a semiconductor substrate

Methods of forming apparatuses and a method of engaging electrically conductive test pads on a semiconductor substrate

Method of engaging electrically conductive test pads on a semiconductor substrate

Apparatuses configured to engage a conductive pad

Method and apparatus for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability

Methods of engaging electrically conductive pads on a semiconductor substrate

Methods of engaging electrically conductive test pads on a semiconductor substrate removable electrical interconnect apparatuses, engagement probes and removable engagement probes

Engagement Probes

Method and apparatus for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability

Method of forming an apparatus configured to engage an electrically conductive pad on a semiconductive substrate and a method of engaging electrically conductive pads on a semiconductive substrate

Engagement probes

Removable electrical interconnect apparatuses including an engagement proble

Methods of forming an apparatus for engaging electrically conductive pads and method of forming a removable electrical interconnect apparatus

SPEEDFAM IPEC CORP

Multiprobe detection system for chemical-mechanical planarization tool

Multiprobe detection system for chemical-mechanical planarization tool

AIR PROD & CHEM

Low dishing copper chemical mechanical planarization

Composite abrasive particles for chemical mechanical planarization composition and method of use thereof

VERSUM MAT US LLC

Composite abrasive particles for chemical mechanical planarization composition and method of use thereof

Chemical mechanical polishing (CMP) of cobalt-containing substrate

MICRON SEMICONDUCTOR INC

Method for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability