Inventor
ICHIKAWA HAJIME
JP14 patents
⚠️ This page may combine multiple inventors who share the name “ICHIKAWA HAJIME”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NIKON CORP
8 patentsUS6456382B2Sep 24, 2002
Interferometer that measures aspherical surfaces
NIKON CORP69 citations96
US6344898B1Feb 5, 2002
Interferometric apparatus and methods for measuring surface topography of a test surface
NIKON CORP79 citations95
US4890245ADec 26, 1989
Method for measuring temperature of semiconductor substrate and apparatus therefor
NIKON CORP81 citations95
US4859832AAug 22, 1989
Light radiation apparatus
NIKON CORP93 citations95
US6032377AMar 7, 2000
Non-spherical surface shape measuring device
NIKON CORP28 citations92
US5982490ANov 9, 1999
Apparatus and method for wavefront absolute calibration and method of synthesizing wavefronts
NIKON CORP39 citations92
US5986760ANov 16, 1999
Shape measurement method and high-precision lens manufacturing process
NIKON CORP23 citations90
US6100980AAug 8, 2000
Magnification calibration apparatus and shape measuring system
NIKON CORP15 citations73
OLYMPUS OPTICAL CO
4 patentsUS4944581AJul 31, 1990
Rear face reflection mirror of multilayer film for synthetic resin optical parts
OLYMPUS OPTICAL CO37 citations92
US4599272AJul 8, 1986
Anti-reflection coating for optical component and method for forming the same
OLYMPUS OPTICAL CO40 citations92
US4988164AJan 29, 1991
Anti-reflection film for synthetic resin optical elements
OLYMPUS OPTICAL CO19 citations81
US4979802ADec 25, 1990
Synthetic resin half-mirror
OLYMPUS OPTICAL CO21 citations81