Inventor · disambiguated record
Kurt J. Bossart
Also filed as: BOSSART KURT J
5 granted patents·8 citations·filing 2016–2020
67Inventor score
Files withMICRON TECHNOLOGY INC5
Top patents by PatentIndex Score
5 records- 0187US9754895B1Methods of forming semiconductor devices including determining misregistration between semiconductor levels and related apparatusesMICRON TECHNOLOGY INC·Filed 2016·Granted Sep 5, 2017·8 cites·25 claims
- 0262US11402426B2Inductive testing probe apparatus for testing semiconductor die and related systems and methodsMICRON TECHNOLOGY INC·Filed 2020·Granted Aug 2, 2022·0 cites·20 claims
- 0356US11094684B2Edge cut debond using a temporary filler material with no adhesive properties and edge cut debond using an engineered carrier to enable topographyMICRON TECHNOLOGY INC·Filed 2019·Granted Aug 17, 2021·0 cites·20 claims
- 0454US10852344B2Inductive testing probe apparatus for testing semiconductor die and related systems and methodsMICRON TECHNOLOGY INC·Filed 2017·Granted Dec 1, 2020·0 cites·30 claims
- 0552US10403618B2Edge cut debond using a temporary filler material with no adhesive properties and edge cut debond using an engineered carrier to enable topographyMICRON TECHNOLOGY INC·Filed 2017·Granted Sep 3, 2019·0 cites·17 claims
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