Inventor
NEISTEIN EYAL
IL7 patents
Patents
7 patentsUS10460434B2Oct 29, 2019
Method of defect detection and system thereof
APPLIED MATERIALS ISRAEL LTD5 citations67
US10275872B2Apr 30, 2019
Method of detecting repeating defects and system thereof
APPLIED MATERIALS ISRAEL LTD2 citations61
US10290087B2May 14, 2019
Method of generating an examination recipe and system thereof
APPLIED MATERIALS ISRAEL LTD1 citations57
US11815470B2Nov 14, 2023
Multi-perspective wafer analysis
APPLIED MATERIALS ISRAEL LTD0 citations47
US11386539B2Jul 12, 2022
Detecting defects in a semiconductor specimen
APPLIED MATERIALS ISRAEL LTD0 citations47
US11107207B2Aug 31, 2021
Detecting targeted locations in a semiconductor specimen
APPLIED MATERIALS ISRAEL LTD0 citations47
US10902582B2Jan 26, 2021
Computerized system and method for obtaining information about a region of an object
APPLIED MATERIALS ISRAEL LTD0 citations47