Inventor
SINGIDI HARISH REDDY
US63 patents
Patents
50 patentsUS11314425B2Apr 26, 2022
Read error recovery
MICRON TECHNOLOGY INC7 citations86
US10777284B2Sep 15, 2020
Read voltage calibration based on host IO operations
MICRON TECHNOLOGY INC4 citations84
US10691377B2Jun 23, 2020
Adjusting scan event thresholds to mitigate memory errors
MICRON TECHNOLOGY INC6 citations84
US10679704B2Jun 9, 2020
NAND temperature data management
MICRON TECHNOLOGY INC4 citations84
US10672452B2Jun 2, 2020
Temperature informed memory refresh
MICRON TECHNOLOGY INC7 citations84
US10586602B2Mar 10, 2020
Read voltage calibration based on host IO operations
MICRON TECHNOLOGY INC6 citations84
US10446237B1Oct 15, 2019
Temperature sensitive NAND programming
MICRON TECHNOLOGY INC13 citations83
US10387281B2Aug 20, 2019
Flash memory block retirement policy
MICRON TECHNOLOGY INC10 citations83
US10325670B2Jun 18, 2019
Erase page check
MICRON TECHNOLOGY INC5 citations83
US10789126B2Sep 29, 2020
Multiple memory devices having parity protection
MICRON TECHNOLOGY INC8 citations82
US10892024B2Jan 12, 2021
Scan optimization from stacking multiple reliability specifications
MICRON TECHNOLOGY INC5 citations81
US11735269B2Aug 22, 2023
Secure erase for data corruption
MICRON TECHNOLOGY INC2 citations73
US11709633B2Jul 25, 2023
Adjusting scan event thresholds to mitigate memory errors
MICRON TECHNOLOGY INC2 citations73
US11335394B2May 17, 2022
Temperature informed memory refresh
MICRON TECHNOLOGY INC1 citations73
US11269553B2Mar 8, 2022
Adjusting scan event thresholds to mitigate memory errors
MICRON TECHNOLOGY INC3 citations73
US11250918B2Feb 15, 2022
Preemptive idle time read scans
MICRON TECHNOLOGY INC1 citations73
US11238939B2Feb 1, 2022
Secure erase for data corruption
MICRON TECHNOLOGY INC2 citations73
US11074989B2Jul 27, 2021
Uncorrectable ECC
MICRON TECHNOLOGY INC3 citations73
US11043278B2Jun 22, 2021
Read voltage calibration based on host IO operations
MICRON TECHNOLOGY INC2 citations73
US11037630B2Jun 15, 2021
NAND temperature data management
MICRON TECHNOLOGY INC2 citations73
US11031089B2Jun 8, 2021
Block read count voltage adjustment
MICRON TECHNOLOGY INC2 citations73
US11023177B2Jun 1, 2021
Temperature correction in memory sub-systems
MICRON TECHNOLOGY INC1 citations73
US10996867B2May 4, 2021
Managing partial superblocks in a NAND device
MICRON TECHNOLOGY INC3 citations73
US10998034B2May 4, 2021
Temperature informed memory refresh
MICRON TECHNOLOGY INC2 citations73
US10950310B2Mar 16, 2021
Secure erase for data corruption
MICRON TECHNOLOGY INC3 citations73
US10915395B2Feb 9, 2021
Read retry with targeted auto read calibrate
MICRON TECHNOLOGY INC2 citations73
US10818361B2Oct 27, 2020
Preemptive idle time read scans
MICRON TECHNOLOGY INC2 citations73
US10796745B2Oct 6, 2020
Temperature informed memory refresh
MICRON TECHNOLOGY INC2 citations73
US10755792B2Aug 25, 2020
Block read count voltage adjustment
MICRON TECHNOLOGY INC2 citations73
US10747612B2Aug 18, 2020
Multi-page parity protection with power loss handling
MICRON TECHNOLOGY INC2 citations73
US10719271B2Jul 21, 2020
Temperature correction in memory sub-systems
MICRON TECHNOLOGY INC4 citations73
US10579307B2Mar 3, 2020
Correcting power loss in NAND memory devices
MICRON TECHNOLOGY INC2 citations73
US10573357B2Feb 25, 2020
Optimized scan interval
MICRON TECHNOLOGY INC2 citations73
US10559369B2Feb 11, 2020
Voltage degradation aware NAND array management
MICRON TECHNOLOGY INC2 citations73
US11488670B2Nov 1, 2022
Temperature sensitive NAND programming
MICRON TECHNOLOGY INC1 citations72
US10930352B2Feb 23, 2021
Temperature sensitive NAND programming
MICRON TECHNOLOGY INC2 citations72
US10824527B2Nov 3, 2020
Flash memory block retirement policy
MICRON TECHNOLOGY INC1 citations72
US11417405B2Aug 16, 2022
Scan optimization from stacking multiple reliability specifications
MICRON TECHNOLOGY INC4 citations71
US11914490B2Feb 27, 2024
Reactive read based on metrics to screen defect prone memory blocks
MICRON TECHNOLOGY INC0 citations63
US11775181B2Oct 3, 2023
Read error recovery
MICRON TECHNOLOGY INC0 citations63
US11726867B2Aug 15, 2023
Multi-page parity protection with power loss handling
MICRON TECHNOLOGY INC0 citations63
US11694760B2Jul 4, 2023
Uncorrectable ECC
MICRON TECHNOLOGY INC0 citations63
US11670381B2Jun 6, 2023
Read voltage calibration based on host IO operations
MICRON TECHNOLOGY INC0 citations63
US11436078B2Sep 6, 2022
NAND parity information techniques for systems with limited RAM
MICRON TECHNOLOGY INC0 citations63
US11334428B2May 17, 2022
Multi-page parity protection with power loss handling
MICRON TECHNOLOGY INC0 citations63
US11216349B2Jan 4, 2022
Reactive read based on metrics to screen defect prone memory blocks
MICRON TECHNOLOGY INC0 citations63
US11068197B2Jul 20, 2021
Tracking data temperatures of logical block addresses
MICRON TECHNOLOGY INC0 citations63
US10977115B2Apr 13, 2021
NAND parity information techniques for systems with limited RAM
MICRON TECHNOLOGY INC1 citations63
US11934689B2Mar 19, 2024
Word line group read counters
MICRON TECHNOLOGY INC0 citations62
US11887651B2Jan 30, 2024
Temperature informed memory refresh
MICRON TECHNOLOGY INC0 citations62
Showing the top 50 of 63 patents by PatentIndex Score.