P

Inventor

WANG MU-CHUN

TW22 patents
⚠️ This page may combine multiple inventors who share the name “WANG MU-CHUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

UNITED MICROELECTRONICS CORP

21 patents
US6242763B1Jun 5, 2001

Low triggering voltage SOI silicon-control-rectifier (SCR) structure

UNITED MICROELECTRONICS CORP74 citations96
US6448599B1Sep 10, 2002

Semiconductor device for preventing process-induced charging damages

UNITED MICROELECTRONICS CORP35 citations92
US6291281B1Sep 18, 2001

Method of fabricating protection structure

UNITED MICROELECTRONICS CORP32 citations92
US5959311ASep 28, 1999

Structure of an antenna effect monitor

UNITED MICROELECTRONICS CORP34 citations92
US6483045B1Nov 19, 2002

Via plug layout structure for connecting different metallic layers

UNITED MICROELECTRONICS CORP40 citations91
US6873505B2Mar 29, 2005

Electrostatic discharge protective circuitry equipped with a common discharge line

UNITED MICROELECTRONICS CORP15 citations84
US6583641B2Jun 24, 2003

Method of determining integrity of a gate dielectric

UNITED MICROELECTRONICS CORP16 citations79
US7217980B2May 15, 2007

CMOS silicon-control-rectifier (SCR) structure for electrostatic discharge (ESD) protection

UNITED MICROELECTRONICS CORP9 citations74
US6235642B1May 22, 2001

Method for reducing plasma charging damages

UNITED MICROELECTRONICS CORP11 citations74
US6060347AMay 9, 2000

Method for preventing damage to gate oxide from well in complementary metal-oxide semiconductor

UNITED MICROELECTRONICS CORP13 citations73
US6878581B1Apr 12, 2005

Electrostatic discharge protection structure and a method for forming the same

UNITED MICROELECTRONICS CORP2 citations62
US6291285B1Sep 18, 2001

Method for protecting gate oxide layer and monitoring damage

UNITED MICROELECTRONICS CORP5 citations62
US6289291B1Sep 11, 2001

Statistical method of monitoring gate oxide layer yield

UNITED MICROELECTRONICS CORP2 citations62
US6110841AAug 29, 2000

Method for avoiding plasma damage

UNITED MICROELECTRONICS CORP6 citations62
US6051986AApr 18, 2000

Method of testing a transistor

UNITED MICROELECTRONICS CORP2 citations62
US6191602B1Feb 20, 2001

Wafer acceptance testing method and structure of a test key used in the method

UNITED MICROELECTRONICS CORP5 citations61
US6269315B1Jul 31, 2001

Reliability testing method of dielectric thin film

UNITED MICROELECTRONICS CORP5 citations60
US6159864ADec 12, 2000

Method of preventing damages of gate oxides of a semiconductor wafer in a plasma-related process

UNITED MICROELECTRONICS CORP3 citations56
US6274494B1Aug 14, 2001

Method of protecting gate oxide

UNITED MICROELECTRONICS CORP1 citations51
US6245610B1Jun 12, 2001

Method of protecting a well at a floating stage

UNITED MICROELECTRONICS CORP1 citations51
US6229347B1May 8, 2001

Circuit for evaluating an asysmetric antenna effect

UNITED MICROELECTRONICS CORP1 citations51

UNITED MICROELECTRONIC CORP

1 patent