Inventor
WANG MU-CHUN
TW22 patents
⚠️ This page may combine multiple inventors who share the name “WANG MU-CHUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
UNITED MICROELECTRONICS CORP
21 patentsUS6242763B1Jun 5, 2001
Low triggering voltage SOI silicon-control-rectifier (SCR) structure
UNITED MICROELECTRONICS CORP74 citations96
US6448599B1Sep 10, 2002
Semiconductor device for preventing process-induced charging damages
UNITED MICROELECTRONICS CORP35 citations92
US6291281B1Sep 18, 2001
Method of fabricating protection structure
UNITED MICROELECTRONICS CORP32 citations92
US5959311ASep 28, 1999
Structure of an antenna effect monitor
UNITED MICROELECTRONICS CORP34 citations92
US6483045B1Nov 19, 2002
Via plug layout structure for connecting different metallic layers
UNITED MICROELECTRONICS CORP40 citations91
US6873505B2Mar 29, 2005
Electrostatic discharge protective circuitry equipped with a common discharge line
UNITED MICROELECTRONICS CORP15 citations84
US6583641B2Jun 24, 2003
Method of determining integrity of a gate dielectric
UNITED MICROELECTRONICS CORP16 citations79
US7217980B2May 15, 2007
CMOS silicon-control-rectifier (SCR) structure for electrostatic discharge (ESD) protection
UNITED MICROELECTRONICS CORP9 citations74
US6235642B1May 22, 2001
Method for reducing plasma charging damages
UNITED MICROELECTRONICS CORP11 citations74
US6060347AMay 9, 2000
Method for preventing damage to gate oxide from well in complementary metal-oxide semiconductor
UNITED MICROELECTRONICS CORP13 citations73
US6878581B1Apr 12, 2005
Electrostatic discharge protection structure and a method for forming the same
UNITED MICROELECTRONICS CORP2 citations62
US6291285B1Sep 18, 2001
Method for protecting gate oxide layer and monitoring damage
UNITED MICROELECTRONICS CORP5 citations62
US6289291B1Sep 11, 2001
Statistical method of monitoring gate oxide layer yield
UNITED MICROELECTRONICS CORP2 citations62
US6110841AAug 29, 2000
Method for avoiding plasma damage
UNITED MICROELECTRONICS CORP6 citations62
US6051986AApr 18, 2000
Method of testing a transistor
UNITED MICROELECTRONICS CORP2 citations62
US6191602B1Feb 20, 2001
Wafer acceptance testing method and structure of a test key used in the method
UNITED MICROELECTRONICS CORP5 citations61
US6269315B1Jul 31, 2001
Reliability testing method of dielectric thin film
UNITED MICROELECTRONICS CORP5 citations60
US6159864ADec 12, 2000
Method of preventing damages of gate oxides of a semiconductor wafer in a plasma-related process
UNITED MICROELECTRONICS CORP3 citations56
US6274494B1Aug 14, 2001
Method of protecting gate oxide
UNITED MICROELECTRONICS CORP1 citations51
US6245610B1Jun 12, 2001
Method of protecting a well at a floating stage
UNITED MICROELECTRONICS CORP1 citations51
US6229347B1May 8, 2001
Circuit for evaluating an asysmetric antenna effect
UNITED MICROELECTRONICS CORP1 citations51