Inventor
GEELS RANDALL S
US18 patents
⚠️ This page may combine multiple inventors who share the name “GEELS RANDALL S”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SDL INC
8 patentsUS6181721B1Jan 30, 2001
Visible wavelength, semiconductor optoelectronic device with a high power broad, significantly laterally uniform, diffraction limited output beam
SDL INC39 citations96
US6148013ANov 14, 2000
Visible wavelength, semiconductor optoelectronic device with a high power broad, significantly laterally uniform, diffraction limited output beam
SDL INC41 citations96
US5933705AAug 3, 1999
Passivation and protection of semiconductor surface
SDL INC31 citations92
US5850411ADec 15, 1998
Transverse electric (TE) polarization mode AlGaInP/GaAs red laser diodes, especially with self-pulsating operation
SDL INC42 citations92
US5799028AAug 25, 1998
Passivation and protection of a semiconductor surface
SDL INC31 citations92
US6148014ANov 14, 2000
Visible wavelength semiconductor optoelectronic device with a high power broad, significantly laterally uniform, diffraction limited output beam
SDL INC15 citations82
US6272162B1Aug 7, 2001
Visible wavelength, semiconductor optoelectronic device with a high power broad, significantly laterally uniform, diffraction limited output beam
SDL INC9 citations73
USRE36802EAug 1, 2000
Transverse electric (TE) polarization mode AlGaInP/GaAs red laser diodes, especially with self-pulsating operation
SDL INC4 citations62
FILMETRICS INC
7 patentsUS6172756B1Jan 9, 2001
Rapid and accurate end point detection in a noisy environment
FILMETRICS INC188 citations98
US6184985B1Feb 6, 2001
Spectrometer configured to provide simultaneous multiple intensity spectra from independent light sources
FILMETRICS INC68 citations95
US7151609B2Dec 19, 2006
Determining wafer orientation in spectral imaging
FILMETRICS INC30 citations92
US7095511B2Aug 22, 2006
Method and apparatus for high-speed thickness mapping of patterned thin films
FILMETRICS INC21 citations92
US7502119B2Mar 10, 2009
Thin-film metrology using spectral reflectance with an intermediate in-line reference
FILMETRICS INC5 citations62
US11099068B2Aug 24, 2021
Optical instrumentation including a spatially variable filter
FILMETRICS INC0 citations51
US8908177B2Dec 9, 2014
Correction of second-order diffraction effects in fiber-optic-based spectrometers
FILMETRICS INC1 citations51