Inventor
LAI FANG-SHI JORDAN
US19 patents
⚠️ This page may combine multiple inventors who share the name “LAI FANG-SHI JORDAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
LAI FANG-SHI JORDAN
11 patentsUS8223047B2Jul 17, 2012
ADC calibration
LAI FANG-SHI JORDAN13 citations91
US8134486B2Mar 13, 2012
DAC calibration
LAI FANG-SHI JORDAN20 citations91
US8279102B2Oct 2, 2012
Method and apparatus for analog to digital conversion
LAI FANG-SHI JORDAN11 citations83
US8692571B2Apr 8, 2014
Apparatus and method for measuring degradation of CMOS VLSI elements
LAI FANG-SHI JORDAN17 citations82
US8493259B2Jul 23, 2013
Pipeline analog-to-digital converter
LAI FANG-SHI JORDAN8 citations82
US8416105B2Apr 9, 2013
ADC calibration apparatus
LAI FANG-SHI JORDAN10 citations82
US9276209B2Mar 1, 2016
Phase change memory with diodes embedded in substrate
LAI FANG-SHI JORDAN2 citations62
US8928508B2Jan 6, 2015
ADC calibration
LAI FANG-SHI JORDAN2 citations61
US8803715B2Aug 12, 2014
Sigma delta modulator including digital to analog coverter (DAC) calibration
LAI FANG-SHI JORDAN2 citations61
US8228221B2Jul 24, 2012
Method and apparatus for calibrating sigma-delta modulator
LAI FANG-SHI JORDAN5 citations61
US8279097B2Oct 2, 2012
Background calibration of analog-to-digital converters
LAI FANG-SHI JORDAN0 citations40
TAIWAN SEMICONDUCTOR MFG
5 patentsUS7154798B2Dec 26, 2006
MRAM arrays and methods for writing and reading magnetic memory devices
TAIWAN SEMICONDUCTOR MFG38 citations92
US7394714B2Jul 1, 2008
Circuit implementation of a dynamic power supply for SRAM core array
TAIWAN SEMICONDUCTOR MFG10 citations84
US7511988B2Mar 31, 2009
Static noise-immune SRAM cells
TAIWAN SEMICONDUCTOR MFG15 citations83
US9344106B2May 17, 2016
ADC calibration
TAIWAN SEMICONDUCTOR MFG2 citations62
US7893853B2Feb 22, 2011
DAC variation-tracking calibration
TAIWAN SEMICONDUCTOR MFG3 citations62