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Inventor
MERKL CHRISTOPH
DE
4 patents
⚠️ This page may combine multiple inventors who share the name “MERKL CHRISTOPH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MATTSON THERMAL PRODUCTS GMBH
2 patents
US7169717B2
Jan 30, 2007
Method of producing a calibration wafer
MATTSON THERMAL PRODUCTS GMBH
13 citations
81
US7412299B2
Aug 12, 2008
Process for determining the temperature of a semiconductor wafer in a rapid heating unit
MATTSON THERMAL PRODUCTS GMBH
2 citations
58
MERKL CHRISTOPH
1 patent
US8335658B2
Dec 18, 2012
Method and apparatus for determining measurement values
MERKL CHRISTOPH
5 citations
51
SCHANZ ROLAND
1 patent
US8282272B2
Oct 9, 2012
Calibration substrate and method of calibration therefor
SCHANZ ROLAND
0 citations
36