Inventor
IFF WOLFGANG ALEXANDER
FR5 patents
Patents
5 patentsUS12444039B2Oct 14, 2025
Method and a system for characterising structures through a substrate
UNITY SEMICONDUCTOR0 citations57
US12079979B2Sep 3, 2024
Method and a system for characterising structures through a substrate
UNITY SEMICONDUCTOR0 citations57
US11959736B2Apr 16, 2024
Method and a system for characterising structures etched in a substrate
UNITY SEMICONDUCTOR0 citations54
US11959737B2Apr 16, 2024
Method and a system for combined characterisation of structures etched in a substrate
UNITY SEMICONDUCTOR0 citations44
US12123698B1Oct 22, 2024
Method and a system for characterizing structures through a substrate
UNITY SEMICONDUCTOR0 citations41