P

Inventor

TAKAHASHI IPPEI

JP13 patents
⚠️ This page may combine multiple inventors who share the name “TAKAHASHI IPPEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

FUJI PHOTO FILM CO LTD

5 patents
US4954723ASep 4, 1990

Disk surface inspection method and apparatus therefor

FUJI PHOTO FILM CO LTD55 citations91
US4982105AJan 1, 1991

Surface inspecting apparatus with strip width dividing means

FUJI PHOTO FILM CO LTD10 citations72
US4868403ASep 19, 1989

Surface inspecting apparatus

FUJI PHOTO FILM CO LTD8 citations71
US5166535ANov 24, 1992

Surface inspecting apparatus with surface inspection width adjustment

FUJI PHOTO FILM CO LTD4 citations61
US6670627B2Dec 30, 2003

Apparatus and method for continuous surface examination comprising a light shielding member at outer ends of the examined surface

FUJI PHOTO FILM CO LTD1 citations51

FUJIFILM TOYAMA CHEMICAL CO LTD

3 patents
US10565545B2Feb 18, 2020

Drug inspection support apparatus and method

FUJIFILM TOYAMA CHEMICAL CO LTD7 citations81
US10896764B2Jan 19, 2021

Drug inspection apparatus and method

FUJIFILM TOYAMA CHEMICAL CO LTD2 citations70
US11651864B2May 16, 2023

Drug inspection apparatus and method

FUJIFILM TOYAMA CHEMICAL CO LTD0 citations60

FUJIFILM CORP

2 patents
US10007993B2Jun 26, 2018

Inspection device, inspection method, and computer readable medium storing program causing computer to perform inspection method

FUJIFILM CORP2 citations71
US9922419B2Mar 20, 2018

Drug information acquisition device and method

FUJIFILM CORP4 citations71

DENSO CORP

2 patents
US11348844B2May 31, 2022

Semiconductor wafer including silicon carbide wafer and method for manufacturing silicon carbide semiconductor device

DENSO CORP2 citations65
US12032062B2Jul 9, 2024

Obstacle detection apparatus

DENSO CORP0 citations49

SHIGETA BUNGO

1 patent
US8654333B2Feb 18, 2014

Surface inspection apparatus and method

SHIGETA BUNGO2 citations54