P

Inventor

LEIDY ROBERT K

US95 patents
⚠️ This page may combine multiple inventors who share the name “LEIDY ROBERT K”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

44 patents
US7781781B2Aug 24, 2010

CMOS imager array with recessed dielectric

IBM65 citations98
US7193289B2Mar 20, 2007

Damascene copper wiring image sensor

IBM89 citations98
US6184151B1Feb 6, 2001

Method for forming cornered images on a substrate and photomask formed thereby

IBM92 citations97
US6513796B2Feb 4, 2003

Wafer chuck having a removable insert

IBM76 citations96
US6344373B1Feb 5, 2002

Antifuse structure and process

IBM45 citations96
US5981148ANov 9, 1999

Method for forming sidewall spacers using frequency doubling hybrid resist and device formed thereby

IBM49 citations96
US5882967AMar 16, 1999

Process for buried diode formation in CMOS

IBM49 citations96
US5874778AFeb 23, 1999

Embedded power and ground plane structure

IBM73 citations96
US5811870ASep 22, 1998

Antifuse structure

IBM49 citations96
US6147394ANov 14, 2000

Method of photolithographically defining three regions with one mask step and self aligned isolation structure formed thereby

IBM54 citations95
US5959325ASep 28, 1999

Method for forming cornered images on a substrate and photomask formed thereby

IBM43 citations95
US6350548B1Feb 26, 2002

Nested overlay measurement target

IBM90 citations94
US7772028B2Aug 10, 2010

CMOS imager with Cu wiring and method of eliminating high reflectivity interfaces therefrom

IBM27 citations93
US7537951B2May 26, 2009

Image sensor including spatially different active and dark pixel interconnect patterns

IBM21 citations93
US7521798B2Apr 21, 2009

Stacked imager package

IBM13 citations93
US7361989B1Apr 22, 2008

Stacked imager package

IBM26 citations93
US7342268B2Mar 11, 2008

CMOS imager with Cu wiring and method of eliminating high reflectivity interfaces therefrom

IBM22 citations93
US6218704B1Apr 17, 2001

ESD protection structure and method

IBM52 citations93
US5939767AAug 17, 1999

Structure and process for buried diode formation in CMOS

IBM21 citations93
US6383719B1May 7, 2002

Process for enhanced lithographic imaging

IBM32 citations92
US6069040AMay 30, 2000

Fabricating a floating gate with field enhancement feature self-aligned to a groove

IBM26 citations92
US5976768ANov 2, 1999

Method for forming sidewall spacers using frequency doubling hybrid resist and device formed thereby

IBM31 citations92
US5972570AOct 26, 1999

Method of photolithographically defining three regions with one mask step and self aligned isolation structure formed thereby

IBM38 citations92
US5861330AJan 19, 1999

Method and structure to reduce latch-up using edge implants

IBM36 citations92
US5552718ASep 3, 1996

Electrical test structure and method for space and line measurement

IBM29 citations92
US5710460AJan 20, 1998

Structure for reducing microelectronic short circuits using spin-on glass as part of the interlayer dielectric

IBM24 citations91
US9874690B2Jan 23, 2018

Integrated waveguide structure with perforated chip edge seal

IBM15 citations84
US9240448B2Jan 19, 2016

Bipolar junction transistors with reduced base-collector junction capacitance

IBM5 citations84
US9093491B2Jul 28, 2015

Bipolar junction transistors with reduced base-collector junction capacitance

IBM7 citations84
US7928527B2Apr 19, 2011

Delamination and crack resistant image sensor structures and methods

IBM9 citations84
US7141836B1Nov 28, 2006

Pixel sensor having doped isolation structure sidewall

IBM14 citations84
US6420766B1Jul 16, 2002

Transistor having raised source and drain

IBM18 citations84
US6716559B2Apr 6, 2004

Method and system for determining overlay tolerance

IBM16 citations82
US5760483AJun 2, 1998

Method for improving visibility of alignment targets in semiconductor processing

IBM16 citations82
US6100013AAug 8, 2000

Method for forming transistors with raised source and drains and device formed thereby

IBM14 citations80
US7491561B2Feb 17, 2009

Pixel sensor having doped isolation structure sidewall

IBM7 citations74
US6815319B2Nov 9, 2004

Damascene resistor and method for measuring the width of same

IBM5 citations74
US6749969B2Jun 15, 2004

Reverse tone process for masks

IBM9 citations74
US6255178B1Jul 3, 2001

Method for forming transistors with raised source and drains and device formed thereby

IBM9 citations74
US6232639B1May 15, 2001

Method and structure to reduce latch-up using edge implants

IBM8 citations74
US6033949AMar 7, 2000

Method and structure to reduce latch-up using edge implants

IBM11 citations74
US6015750AJan 18, 2000

Method for improving visibility of alignment target in semiconductor processing

IBM5 citations74
US10476227B2Nov 12, 2019

Dual bond pad structure for photonics

IBM3 citations73
US9608403B2Mar 28, 2017

Dual bond pad structure for photonics

IBM2 citations73

ADKISSON JAMES W

2 patents

GLOBALFOUNDRIES INC

2 patents

GAMBINO JEFFREY P

1 patent

INTERNAT BUSINESS MACHIENS COR

1 patent

Showing the top 50 of 95 patents by PatentIndex Score.