P

Inventor

NISHIMURA TADASHI

JP68 patents
⚠️ This page may combine multiple inventors who share the name “NISHIMURA TADASHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MITSUBISHI ELECTRIC CORP

41 patents
US5659194AAug 19, 1997

Semiconductor device having metal silicide film

MITSUBISHI ELECTRIC CORP239 citations99
US5557231ASep 17, 1996

Semiconductor device with improved substrate bias voltage generating circuit

MITSUBISHI ELECTRIC CORP167 citations99
US5801080ASep 1, 1998

Method of manufacturing semiconductor substrate having total and partial dielectric isolation

MITSUBISHI ELECTRIC CORP29 citations96
US5440161AAug 8, 1995

Semiconductor device having an SOI structure and a manufacturing method thereof

MITSUBISHI ELECTRIC CORP91 citations96
US5357365AOct 18, 1994

Laser beam irradiating apparatus enabling uniform laser annealing

MITSUBISHI ELECTRIC CORP93 citations96
US5283455AFeb 1, 1994

Thin film field effect element having an LDD structure

MITSUBISHI ELECTRIC CORP66 citations96
US5125007AJun 23, 1992

Thin-film soi-mosfet with a body region

MITSUBISHI ELECTRIC CORP76 citations96
US5001539AMar 19, 1991

Multiple layer static random access memory device

MITSUBISHI ELECTRIC CORP100 citations96
US4845537AJul 4, 1989

Vertical type MOS transistor and method of formation thereof

MITSUBISHI ELECTRIC CORP101 citations96
US4694143ASep 15, 1987

Zone melting apparatus for monocrystallizing semiconductor layer on insulator layer

MITSUBISHI ELECTRIC CORP72 citations96
US4514895AMay 7, 1985

Method of forming field-effect transistors using selectively beam-crystallized polysilicon channel regions

MITSUBISHI ELECTRIC CORP79 citations96
US4465529AAug 14, 1984

Method of producing semiconductor device

MITSUBISHI ELECTRIC CORP81 citations96
US4984033AJan 8, 1991

Thin film semiconductor device with oxide film on insulating layer

MITSUBISHI ELECTRIC CORP99 citations95
US4822751AApr 18, 1989

Method of producing a thin film semiconductor device

MITSUBISHI ELECTRIC CORP66 citations95
US5017504AMay 21, 1991

Vertical type MOS transistor and method of formation thereof

MITSUBISHI ELECTRIC CORP177 citations94
US6649976B2Nov 18, 2003

Semiconductor device having metal silicide film and manufacturing method thereof

MITSUBISHI ELECTRIC CORP25 citations93
US6319805B1Nov 20, 2001

Semiconductor device having metal silicide film and manufacturing method thereof

MITSUBISHI ELECTRIC CORP21 citations93
US6051494AApr 18, 2000

Semiconductor device having metal silicide film

MITSUBISHI ELECTRIC CORP22 citations93
US5619053AApr 8, 1997

Semiconductor device having an SOI structure

MITSUBISHI ELECTRIC CORP24 citations93
US5471086ANov 28, 1995

Semiconductor device having piezo resistance

MITSUBISHI ELECTRIC CORP38 citations93
US5381235AJan 10, 1995

Three-dimensional shape measuring device and three-dimensional shape measuring sensor

MITSUBISHI ELECTRIC CORP22 citations93
US5343051AAug 30, 1994

Thin-film SOI MOSFET

MITSUBISHI ELECTRIC CORP29 citations93
US4993835AFeb 19, 1991

Apparatus for detecting three-dimensional configuration of object employing optical cutting method

MITSUBISHI ELECTRIC CORP33 citations93
US4914628AApr 3, 1990

Semiconductor memory device having substrate isolation of a switching transistor and storage capacitor

MITSUBISHI ELECTRIC CORP28 citations93
US5441899AAug 15, 1995

Method of manufacturing substrate having semiconductor on insulator

MITSUBISHI ELECTRIC CORP41 citations92
US4948742AAug 14, 1990

Method of manufacturing a semiconductor device

MITSUBISHI ELECTRIC CORP33 citations92
US5891265AApr 6, 1999

SOI substrate having monocrystal silicon layer on insulating film

MITSUBISHI ELECTRIC CORP44 citations91
US5741717AApr 21, 1998

Method of manufacturing a SOI substrate having a monocrystalline silicon layer on insulating film

MITSUBISHI ELECTRIC CORP23 citations91
US5060035AOct 22, 1991

Silicon-on-insulator metal oxide semiconductor device having conductive sidewall structure

MITSUBISHI ELECTRIC CORP43 citations91
US6358783B1Mar 19, 2002

Semiconductor device and method of manufacturing the same

MITSUBISHI ELECTRIC CORP14 citations84
US4523962AJun 18, 1985

Method for fabricating monocrystalline semiconductor layer on insulating layer by laser crystallization using a grid of anti-reflection coating disposed on poly/amorphous semiconductor

MITSUBISHI ELECTRIC CORP23 citations82
US6459125B2Oct 1, 2002

SOI based transistor inside an insulation layer with conductive bump on the insulation layer

MITSUBISHI ELECTRIC CORP12 citations74
US6351014B2Feb 26, 2002

Semiconductor device having different field oxide sizes

MITSUBISHI ELECTRIC CORP4 citations74
US6198134B1Mar 6, 2001

Semiconductor device having a common substrate bias

MITSUBISHI ELECTRIC CORP9 citations74
US6069379AMay 30, 2000

Semiconductor device and method of manufacturing the same

MITSUBISHI ELECTRIC CORP11 citations74
US5616507AApr 1, 1997

Method of manufacturing substrate having semiconductor on insulator

MITSUBISHI ELECTRIC CORP14 citations74
US5424225AJun 13, 1995

Method of manufacturing a thin film SOI MOSFET

MITSUBISHI ELECTRIC CORP13 citations74
US5336918AAug 9, 1994

Semiconductor pressure sensor and method of fabricating the same

MITSUBISHI ELECTRIC CORP10 citations74
US5094714AMar 10, 1992

Wafer structure for forming a semiconductor single crystal film

MITSUBISHI ELECTRIC CORP7 citations74
US4987092AJan 22, 1991

Process for manufacturing stacked semiconductor devices

MITSUBISHI ELECTRIC CORP16 citations74
US4787740ANov 29, 1988

Apparatus and method for determining crystal orientation

MITSUBISHI ELECTRIC CORP7 citations74

KOZO IIZUKA DIRECTOR GENERAL A

2 patents

AGENCY IND SCIENCE TECHN

2 patents

(unassigned)

1 patent

MITSUI PETROCHEMICAL IND

1 patent

PANASONIC CORP

1 patent

KAWASHIMA AKIHIRO

1 patent

MITSUBISHI CHEM CORP

1 patent

Showing the top 50 of 68 patents by PatentIndex Score.