Inventor

OKAYASU TOSHIYUKI

JP118 patents

⚠️ This page may combine multiple inventors who share the name “OKAYASU TOSHIYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

OKAYASU TOSHIYUKI

ADVANTEST CORP

Opitcal/electrical hybrid wiring board and its manufacturing method

Integrated circuit device tester

Test signal generator having timing calibration circuit

Test equipment and semiconductor device

Delay clock generating apparatus and delay time measuring apparatus

Variable delay circuit

Timing calibration apparatus and method in a semiconductor integrated circuit tester

CMOS integrated circuit and timing signal generator using same

Delay signal generating apparatus and semiconductor test apparatus

Method and apparatus for driving laser diode

Optical signal transmission apparatus and optical signal transmission method

Method of signal transmission between semiconductor integrated circuits and output drive circuit for use therewith

Method of measuring delay time and random pulse train generating circuit used in such method

Signal transmission cable driver apparatus without a peaking coil

Delay time measurement apparatus for delay circuit

Timing signal generation circuit

Variable delay circuit

Driver circuit with temperature correction circuit

Semiconductor test apparatus

Method for correcting timing for IC tester and IC tester having correcting function using the correcting method

Wafer unit for testing semiconductor chips and test system

Power supply stabilizing circuit, an electronic device and a test apparatus

Semiconductor testing apparatus with a variable delay circuit

Timing generator, semiconductor test apparatus, and timing generating method

Timing generating apparatus and test apparatus

Optically driven driver, optical output type voltage sensor, and IC testing equipment using these devices

Power supply circuit for driving an integrated circuit, wherein the power supply is adjusted based on temperature so that a delay variation within the IC according to temperature may be cancelled

Timing comparator, data sampling apparatus, and testing apparatus

Test apparatus

Delay circuit, testing apparatus, and capacitor

Signal transmission circuit, CMOS semiconductor device, and circuit board

Delay device, semiconductor testing device, semiconductor device, and oscilloscope

Delay time judging apparatus

Delay circuit, testing apparatus, and capacitor

CMOS integrated circuit and timing signal generator using same

Delay time control circuit

Semiconductor integrated circuit

Signal transmission circuit, CMOS semiconductor device, and circuit board

Driver circuit with temperature correction circuit

Logic signal selection circuit

Clock recovery circuit and communication device

Semiconductor test apparatus

WATANABE DAISUKE

Test apparatus for digital modulated signal

Test apparatus and test method

Test apparatus for digital modulated signal

YAMAMOTO KAZUHIRO

Time measurement circuit

UNIV TOHOKU NAT UNIV CORP

Electronic device identifying method

FURUKAWA ELECTRIC CO LTD

Test apparatus and cable guide unit

ISHIDA MASAHIRO

Test apparatus and testing method

OKAYASU TOSHIYUKI

Noise measurement apparatus and test apparatus