Inventor
KOHNO YUJI
JP19 patents
⚠️ This page may combine multiple inventors who share the name “KOHNO YUJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
JEOL LTD
17 patentsUS10714308B2Jul 14, 2020
Measurement method and electron microscope
JEOL LTD2 citations71
US10014153B2Jul 3, 2018
Electron microscope and method of aberration measurement
JEOL LTD3 citations71
US10224173B2Mar 5, 2019
Objective lens and transmission electron microscope
JEOL LTD3 citations68
US11508550B2Nov 22, 2022
Method and apparatus for image processing
JEOL LTD0 citations61
US11456151B2Sep 27, 2022
Image acquisition method and electron microscope
JEOL LTD0 citations61
US11031208B2Jun 8, 2021
Cold cathode field-emission electron gun, adjustment method for cold cathode field-emission electron gun, sharpening method for emitter, and electron microscope
JEOL LTD0 citations61
US10886099B2Jan 5, 2021
Method of aberration measurement and electron microscope
JEOL LTD0 citations57
US11462384B2Oct 4, 2022
Method of acquiring dark-field image
JEOL LTD0 citations50
US11251013B2Feb 15, 2022
Deflector and charged particle beam system
JEOL LTD0 citations50
US11251016B2Feb 15, 2022
Method of controlling transmission electron microscope and transmission electron microscope
JEOL LTD0 citations50
US9779911B2Oct 3, 2017
Electron microscope and method of measuring aberrations
JEOL LTD0 citations50
US9728372B2Aug 8, 2017
Measurement method and electron microscope
JEOL LTD0 citations50
US10840058B2Nov 17, 2020
Aberration measurement method and electron microscope
JEOL LTD0 citations47
US9396904B2Jul 19, 2016
Multipole lens, method of fabricating same, and charged particle beam system
JEOL LTD0 citations47
US12518944B2Jan 6, 2026
Electron microscope and image acquisition method
JEOL LTD0 citations43
US9576768B2Feb 21, 2017
Multipole lens and charged particle beam system
JEOL LTD0 citations40
US8859964B2Oct 14, 2014
Electron microscope and method of adjusting the same
JEOL LTD0 citations40