Inventor
DIXIT GIRISH A
US47 patents
⚠️ This page may combine multiple inventors who share the name “DIXIT GIRISH A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SGS THOMSON MICROELECTRONICS
19 patentsUS5108951AApr 28, 1992
Method for forming a metal contact
SGS THOMSON MICROELECTRONICS80 citations96
US5593921AJan 14, 1997
Method of forming vias
SGS THOMSON MICROELECTRONICS37 citations93
US5523624AJun 4, 1996
Integrated circuit device structure with dielectric and metal stacked plug in contact hole
SGS THOMSON MICROELECTRONICS28 citations93
US5348901ASep 20, 1994
Interconnect and resistor for integrated circuits
SGS THOMSON MICROELECTRONICS20 citations93
US5244827ASep 14, 1993
Method for planarized isolation for cmos devices
SGS THOMSON MICROELECTRONICS22 citations93
US5278098AJan 11, 1994
Method for self-aligned polysilicon contact formation
SGS THOMSON MICROELECTRONICS36 citations90
US5493144AFeb 20, 1996
Field progammable device with contact openings
SGS THOMSON MICROELECTRONICS17 citations82
US5582971ADec 10, 1996
Method of forming submicron contacts
SGS THOMSON MICROELECTRONICS13 citations74
US5578872ANov 26, 1996
Planar contact with a void
SGS THOMSON MICROELECTRONICS7 citations74
US5571752ANov 5, 1996
Method of forming a planar contact with a void
SGS THOMSON MICROELECTRONICS10 citations74
US5521411AMay 28, 1996
Transistor spacer etch pinpoint structure
SGS THOMSON MICROELECTRONICS9 citations74
US5510294AApr 23, 1996
Method of forming vias for multilevel metallization
SGS THOMSON MICROELECTRONICS11 citations74
US5444019AAug 22, 1995
Semiconductor contact via structure and method
SGS THOMSON MICROELECTRONICS11 citations74
US5440166AAug 8, 1995
Planarized isolation structure for CMOS devices
SGS THOMSON MICROELECTRONICS10 citations74
US5369302ANov 29, 1994
Method to improve step coverage by contact reflow
SGS THOMSON MICROELECTRONICS7 citations74
US5317192AMay 31, 1994
Semiconductor contact via structure having amorphous silicon side walls
SGS THOMSON MICROELECTRONICS15 citations74
US5182627AJan 26, 1993
Interconnect and resistor for integrated circuits
SGS THOMSON MICROELECTRONICS8 citations74
US5233135AAug 3, 1993
Interconnect for integrated circuits
SGS THOMSON MICROELECTRONICS4 citations63
US5491355AFeb 13, 1996
Self-aligned contact formation
SGS THOMSON MICROELECTRONICS2 citations60
APPLIED MATERIALS INC
10 patentsUS7018941B2Mar 28, 2006
Post treatment of low k dielectric films
APPLIED MATERIALS INC674 citations98
US6821909B2Nov 23, 2004
Post rinse to improve selective deposition of electroless cobalt on copper for ULSI application
APPLIED MATERIALS INC62 citations96
US7115534B2Oct 3, 2006
Dielectric materials to prevent photoresist poisoning
APPLIED MATERIALS INC39 citations93
US6566258B1May 20, 2003
Bi-layer etch stop for inter-level via
APPLIED MATERIALS INC42 citations93
US7205228B2Apr 17, 2007
Selective metal encapsulation schemes
APPLIED MATERIALS INC40 citations92
US6951599B2Oct 4, 2005
Electropolishing of metallic interconnects
APPLIED MATERIALS INC21 citations92
US6824666B2Nov 30, 2004
Electroless deposition method over sub-micron apertures
APPLIED MATERIALS INC42 citations91
US6878245B2Apr 12, 2005
Method and apparatus for reducing organic depletion during non-processing time periods
APPLIED MATERIALS INC12 citations83
US7425716B2Sep 16, 2008
Method and apparatus for reducing charge density on a dielectric coated substrate after exposure to a large area electron beam
APPLIED MATERIALS INC14 citations82
US6869516B2Mar 22, 2005
Method for removing electrolyte from electrical contacts and wafer touching areas
APPLIED MATERIALS INC2 citations63
TEXAS INSTRUMENTS INC
10 patentsUS6130156AOct 10, 2000
Variable doping of metal plugs for enhanced reliability
TEXAS INSTRUMENTS INC87 citations98
US6358849B1Mar 19, 2002
Integrated circuit interconnect and method
TEXAS INSTRUMENTS INC66 citations95
US6589865B2Jul 8, 2003
Low pressure, low temperature, semiconductor gap filling process
TEXAS INSTRUMENTS INC23 citations92
US6333265B1Dec 25, 2001
Low pressure, low temperature, semiconductor gap filling process
TEXAS INSTRUMENTS INC22 citations92
US6297125B1Oct 2, 2001
Air-bridge integration scheme for reducing interconnect delay
TEXAS INSTRUMENTS INC52 citations92
US5849367ADec 15, 1998
Elemental titanium-free liner and fabrication process for inter-metal connections
TEXAS INSTRUMENTS INC22 citations92
US6251771B1Jun 26, 2001
Hydrogen passivation of chemical-mechanically polished copper-containing layers
TEXAS INSTRUMENTS INC16 citations84
US6268297B1Jul 31, 2001
Self-planarizing low-temperature doped-silicate-glass process capable of gap-filling narrow spaces
TEXAS INSTRUMENTS INC18 citations83
US6159847ADec 12, 2000
Multilayer metal structure for improved interconnect reliability
TEXAS INSTRUMENTS INC11 citations74
US6962883B2Nov 8, 2005
Integrated circuit insulator and method
TEXAS INSTRUMENTS INC4 citations62
NOVELLUS SYSTEMS INC
3 patentsUS7510634B1Mar 31, 2009
Apparatus and methods for deposition and/or etch selectivity
NOVELLUS SYSTEMS INC33 citations93
US9905423B2Feb 27, 2018
Soft landing nanolaminates for advanced patterning
NOVELLUS SYSTEMS INC5 citations84
US10192742B2Jan 29, 2019
Soft landing nanolaminates for advanced patterning
NOVELLUS SYSTEMS INC1 citations73