Inventor
YOSHINO HISAKAZU
JP20 patents
⚠️ This page may combine multiple inventors who share the name “YOSHINO HISAKAZU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOKYO OPTICAL
8 patentsUS4711541ADec 8, 1987
Slit lamp and accessory device thereof
TOKYO OPTICAL61 citations96
US4711540ADec 8, 1987
Eye disease inspecting instrument
TOKYO OPTICAL40 citations92
US4702570AOct 27, 1987
Stereo-microscope with two observation optical systems each including a right angle prism and a roof right angle prism providing both rotation and relative separation adjustments
TOKYO OPTICAL25 citations92
US4632528ADec 30, 1986
Method for determining refractive index of an object
TOKYO OPTICAL38 citations91
US4601550AJul 22, 1986
Stereo-microscope with a common objective lens system
TOKYO OPTICAL18 citations82
US4571842AFeb 25, 1986
Lens judging apparatus of lens meter
TOKYO OPTICAL12 citations73
US4597650AJul 1, 1986
Specular microscope
TOKYO OPTICAL5 citations62
US4564291AJan 14, 1986
Projection type lensmeter
TOKYO OPTICAL5 citations56
TOPCON CORP
7 patentsUS6104481AAug 15, 2000
Surface inspection apparatus
TOPCON CORP113 citations95
US5673135ASep 30, 1997
Scanning projection optical device
TOPCON CORP18 citations81
US6100970AAug 8, 2000
Apparatus for inspecting slight defects on a photomask pattern
TOPCON CORP6 citations74
US5812259ASep 22, 1998
Method and apparatus for inspecting slight defects in a photomask pattern
TOPCON CORP7 citations74
US5369521ANov 29, 1994
Scanning type projector
TOPCON CORP12 citations73
US5298096AMar 29, 1994
Method of producing a lens
TOPCON CORP10 citations68
US5448416ASep 5, 1995
Wide-field exposure optical system
TOPCON CORP3 citations60
TOSHIBA KK
5 patentsUS6084716AJul 4, 2000
Optical substrate inspection apparatus
TOSHIBA KK89 citations96
US4902133AFeb 20, 1990
Method and an apparatus for aligning first and second objects with each other
TOSHIBA KK25 citations92
US5828457AOct 27, 1998
Sample inspection apparatus and sample inspection method
TOSHIBA KK14 citations74
US4808002AFeb 28, 1989
Method and device for aligning first and second objects relative to each other
TOSHIBA KK7 citations74
US4984890AJan 15, 1991
Method and an apparatus for aligning first and second objects with each other
TOSHIBA KK15 citations73