Inventor
TANIOKA MICHINOBU
JP15 patents
Patents
15 patentsUS6078229AJun 20, 2000
Surface acoustic wave device mounted with a resin film and method of making same
NEC CORP135 citations97
US5784264AJul 21, 1998
MCM (Multi Chip Module) carrier with external connection teminals BGA (Ball Grid Array) type matrix array form
NEC CORP69 citations95
US7218131B2May 15, 2007
Inspection probe, method for preparing the same, and method for inspecting elements
NEC CORP44 citations92
US6906546B2Jun 14, 2005
Semiconductor device inspection apparatus and inspection method
NEC CORP42 citations92
US6078123AJun 20, 2000
Structure and method for mounting a saw device
NEC CORP51 citations92
US6013953AJan 11, 2000
Semiconductor device with improved connection reliability
NEC CORP28 citations92
US5668058ASep 16, 1997
Method of producing a flip chip
NEC CORP23 citations92
US7906846B2Mar 15, 2011
Semiconductor device for implementing signal transmission and/or power supply by means of the induction of a coil
NEC CORP8 citations83
US6667627B2Dec 23, 2003
Probe for inspecting semiconductor device and method of manufacturing the same
NEC CORP7 citations74
US6426878B2Jul 30, 2002
Bare chip carrier utilizing a pressing member
NEC CORP11 citations74
US6396290B1May 28, 2002
Test carrier and method of mounting semiconductor device thereon
NEC CORP12 citations74
US7852101B2Dec 14, 2010
Semiconductor device testing apparatus and power supply unit for semiconductor device testing apparatus
NEC CORP7 citations73
US6486688B2Nov 26, 2002
Semiconductor device testing apparatus having a contact sheet and probe for testing high frequency characteristics
NEC CORP8 citations73
US7548082B2Jun 16, 2009
Inspection probe
NEC CORP2 citations62
US6433410B2Aug 13, 2002
Semiconductor device tester and method of testing semiconductor device
NEC CORP6 citations62