Inventor
YOO CHUE-SAN
TW61 patents
⚠️ This page may combine multiple inventors who share the name “YOO CHUE-SAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG
41 patentsUS6071783AJun 6, 2000
Pseudo silicon on insulator MOSFET device
TAIWAN SEMICONDUCTOR MFG175 citations99
US6346729B1Feb 12, 2002
Pseudo silicon on insulator MOSFET device
TAIWAN SEMICONDUCTOR MFG110 citations98
US6168984B1Jan 2, 2001
Reduction of the aspect ratio of deep contact holes for embedded DRAM devices
TAIWAN SEMICONDUCTOR MFG61 citations96
US6017791AJan 25, 2000
Multi-layer silicon nitride deposition method for forming low oxidation temperature thermally oxidized silicon nitride/silicon oxide (no) layer
TAIWAN SEMICONDUCTOR MFG84 citations96
US5858830AJan 12, 1999
Method of making dual isolation regions for logic and embedded memory devices
TAIWAN SEMICONDUCTOR MFG60 citations96
US5729041AMar 17, 1998
Protective film for fuse window passivation for semiconductor integrated circuit applications
TAIWAN SEMICONDUCTOR MFG62 citations96
US5578517ANov 26, 1996
Method of forming a highly transparent silicon rich nitride protective layer for a fuse window
TAIWAN SEMICONDUCTOR MFG50 citations96
US5545588AAug 13, 1996
Method of using disposable hard mask for gate critical dimension control
TAIWAN SEMICONDUCTOR MFG56 citations96
US5372957ADec 13, 1994
Multiple tilted angle ion implantation MOSFET method
TAIWAN SEMICONDUCTOR MFG92 citations96
US5393685AFeb 28, 1995
Peeling free metal silicide films using rapid thermal anneal
TAIWAN SEMICONDUCTOR MFG64 citations95
US5180689AJan 19, 1993
Tapered opening sidewall with multi-step etching process
TAIWAN SEMICONDUCTOR MFG62 citations94
US6271125B1Aug 7, 2001
Method to reduce contact hole aspect ratio for embedded DRAM arrays and logic devices, via the use of a tungsten bit line structure
TAIWAN SEMICONDUCTOR MFG42 citations93
US6200836B1Mar 13, 2001
Using oxide junction to cut off sub-threshold leakage in CMOS devices
TAIWAN SEMICONDUCTOR MFG45 citations93
US6177340B1Jan 23, 2001
Method to reduce contact hole aspect ratio for embedded DRAM arrays and logic devices, via the use of a tungsten bit line structure
TAIWAN SEMICONDUCTOR MFG39 citations93
US6025270AFeb 15, 2000
Planarization process using tailored etchback and CMP
TAIWAN SEMICONDUCTOR MFG24 citations93
US6015730AJan 18, 2000
Integration of SAC and salicide processes by combining hard mask and poly definition
TAIWAN SEMICONDUCTOR MFG54 citations93
US5866451AFeb 2, 1999
Method of making a semiconductor device having 4t sram and mixed-mode capacitor in logic
TAIWAN SEMICONDUCTOR MFG45 citations93
US5861673AJan 19, 1999
Method for forming vias in multi-level integrated circuits, for use with multi-level metallizations
TAIWAN SEMICONDUCTOR MFG44 citations93
US5719079AFeb 17, 1998
Method of making a semiconductor device having high density 4T SRAM in logic with salicide process
TAIWAN SEMICONDUCTOR MFG35 citations93
US5712201AJan 27, 1998
Fabrication method for integrating logic and single level polysilicon DRAM devices on the same semiconductor chip
TAIWAN SEMICONDUCTOR MFG31 citations93
US5670423ASep 23, 1997
Method for using disposable hard mask for gate critical dimension control
TAIWAN SEMICONDUCTOR MFG22 citations93
US5605853AFeb 25, 1997
Method of making a semiconductor device having 4 transistor SRAM and floating gate memory cells
TAIWAN SEMICONDUCTOR MFG49 citations93
US5605854AFeb 25, 1997
Integrated Ti-W polycide for deep submicron processing
TAIWAN SEMICONDUCTOR MFG42 citations93
US5573980ANov 12, 1996
Method of forming salicided self-aligned contact for SRAM cells
TAIWAN SEMICONDUCTOR MFG30 citations93
US5324689AJun 28, 1994
Critical dimension control with a planarized underlayer
TAIWAN SEMICONDUCTOR MFG20 citations93
US5089432AFeb 18, 1992
Polycide gate MOSFET process for integrated circuits
TAIWAN SEMICONDUCTOR MFG42 citations93
US5965927AOct 12, 1999
Integrated circuit having an opening for a fuse
TAIWAN SEMICONDUCTOR MFG23 citations92
US5879966AMar 9, 1999
Method of making an integrated circuit having an opening for a fuse
TAIWAN SEMICONDUCTOR MFG33 citations92
US5541131AJul 30, 1996
Peeling free metal silicide films using ion implantation
TAIWAN SEMICONDUCTOR MFG48 citations92
US5203957AApr 20, 1993
Contact sidewall tapering with argon sputtering
TAIWAN SEMICONDUCTOR MFG60 citations92
US6033969AMar 7, 2000
Method of forming a shallow trench isolation that has rounded and protected corners
TAIWAN SEMICONDUCTOR MFG43 citations87
US6054368AApr 25, 2000
Method of making an improved field oxide isolation structure for semiconductor integrated circuits having higher field oxide threshold voltages
TAIWAN SEMICONDUCTOR MFG8 citations74
US5900658AMay 4, 1999
Logic and single level polysilicon DRAM devices fabricated on the same semiconductor chip
TAIWAN SEMICONDUCTOR MFG6 citations74
US5726093AMar 10, 1998
Two-step planer field oxidation method
TAIWAN SEMICONDUCTOR MFG8 citations74
US5585307ADec 17, 1996
Forming a semi-recessed metal for better EM and Planarization using a silo mask
TAIWAN SEMICONDUCTOR MFG17 citations74
US5470779ANov 28, 1995
Method of manufacture of SRAM with SIPOS resistor
TAIWAN SEMICONDUCTOR MFG11 citations74
US5268244ADec 7, 1993
Self-aligned phase shifter formation
TAIWAN SEMICONDUCTOR MFG17 citations74
US5943569AAug 24, 1999
Method for making improved capacitors on dynamic random access memory having increased capacitance, longer refresh times, and improved yields
TAIWAN SEMICONDUCTOR MFG9 citations70
US5411907AMay 2, 1995
Capping free metal silicide integrated process
TAIWAN SEMICONDUCTOR MFG17 citations69
US7839480B2Nov 23, 2010
Photomask haze reduction via ventilation
TAIWAN SEMICONDUCTOR MFG3 citations63
US6670690B1Dec 30, 2003
Method of making an improved field oxide isolation structure for semiconductor integrated circuits having higher field oxide threshold voltages
TAIWAN SEMICONDUCTOR MFG3 citations63
TAIWAN SEMICONDUCTOR MFG CO LTD
8 patentsUS11143952B2Oct 12, 2021
Pellicle removal method
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US10126666B2Nov 13, 2018
Apparatus and a method of forming a particle shield
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations83
US12013632B2Jun 18, 2024
Pellicle having vent hole
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11506971B2Nov 22, 2022
Pellicle and method of using the same
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10670959B2Jun 2, 2020
Pellicle and method of using the same
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10168626B2Jan 1, 2019
Apparatus and a method of forming a particle shield
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations72
US11868041B2Jan 9, 2024
Pellicle and method of using the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US11289341B2Mar 29, 2022
Pattern transfer technique and method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
LIN CHENG-MING
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