Inventor
YOON JONGHEE
KR4 patents
Patents
4 patentsUS11262287B2Mar 1, 2022
Apparatus for detecting sample properties using chaotic wave sensor
KOREA ADVANCED INST SCI & TECH2 citations70
US10914665B2Feb 9, 2021
Apparatus for detecting sample properties using chaotic wave sensor
KOREA ADVANCED INST SCI & TECH1 citations70
US10001467B2Jun 19, 2018
Apparatus and method for detecting microbes or bacteria
KOREA ADVANCED INST SCI & TECH6 citations69
US10551293B2Feb 4, 2020
Apparatus for detecting sample properties using chaotic wave sensor
KOREA ADVANCED INST SCI & TECH0 citations49