Inventor
GHOSH NILANJAN Z
US3 patents
Patents
3 patentsUS9746428B2Aug 29, 2017
Inline inspection of the contact between conductive traces and substrate for hidden defects using white light interferometer with tilted objective lens
INTEL CORP3 citations70
US9508610B2Nov 29, 2016
Inline measurement of molding material thickness using terahertz reflectance
INTEL CORP5 citations68
US10078204B2Sep 18, 2018
Non-destructive 3-dimensional chemical imaging of photo-resist material
INTEL CORP0 citations39