P

Inventor

SKROVAN JOHN

US17 patents

Patents

17 patents
US6203413B1Mar 20, 2001

Apparatus and methods for conditioning polishing pads in mechanical and/or chemical-mechanical planarization of microelectronic-device substrate assemblies

MICRON TECHNOLOGY INC189 citations99
US5645682AJul 8, 1997

Apparatus and method for conditioning a planarizing substrate used in chemical-mechanical planarization of semiconductor wafers

MICRON TECHNOLOGY INC209 citations99
US6060395AMay 9, 2000

Planarization method using a slurry including a dispersant

MICRON TECHNOLOGY INC98 citations98
US6361413B1Mar 26, 2002

Apparatus and methods for conditioning polishing pads in mechanical and/or chemical-mechanical planarization of microelectronic device substrate assemblies

MICRON TECHNOLOGY INC56 citations96
US6136218AOct 24, 2000

Planarization fluid composition including chelating agents

MICRON TECHNOLOGY INC48 citations96
US6048405AApr 11, 2000

Megasonic cleaning methods and apparatus

MICRON TECHNOLOGY INC43 citations96
US6006765ADec 28, 1999

Megasonic cleaning methods and apparatus

MICRON TECHNOLOGY INC47 citations96
US5916819AJun 29, 1999

Planarization fluid composition chelating agents and planarization method using same

MICRON TECHNOLOGY INC87 citations96
US5849091ADec 15, 1998

Megasonic cleaning methods and apparatus

MICRON TECHNOLOGY INC78 citations96
US5846336ADec 8, 1998

Apparatus and method for conditioning a planarizing substrate used in mechanical and chemical-mechanical planarization of semiconductor wafers

MICRON TECHNOLOGY INC90 citations96
US5827781AOct 27, 1998

Planarization slurry including a dispersant and method of using same

MICRON TECHNOLOGY INC82 citations96
US6110830AAug 29, 2000

Methods of reducing corrosion of materials, methods of protecting aluminum within aluminum-comprising layers from electrochemical degradation during semiconductor processing methods of forming aluminum-comprising lines

MICRON TECHNOLOGY INC33 citations92
US6391779B1May 21, 2002

Planarization process

MICRON TECHNOLOGY INC16 citations84
US6280924B1Aug 28, 2001

Planarization method using fluid composition including chelating agents

MICRON TECHNOLOGY INC5 citations74
US6277746B1Aug 21, 2001

Methods of reducing corrosion of materials, methods of protecting aluminum within aluminum-comprising layers from electrochemical degradation during semiconductor processing, and semicoductor processing methods of forming aluminum-comprising lines

MICRON TECHNOLOGY INC6 citations74
US6509272B2Jan 21, 2003

Planarization method using fluid composition including chelating agents

MICRON TECHNOLOGY INC1 citations63
US6739955B2May 25, 2004

Apparatus and methods for conditioning polishing pads in mechanical and/or chemical-mechanical planarization of microelectronic-device substrate assemblies

MICRON TECHNOLOGY INC0 citations52