Inventor
SAKAI MINEKAZU
JP75 patents
⚠️ This page may combine multiple inventors who share the name “SAKAI MINEKAZU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
DENSO CORP
39 patentsUS6494096B2Dec 17, 2002
Semiconductor physical quantity sensor
DENSO CORP91 citations98
US6240782B1Jun 5, 2001
Semiconductor physical quantity sensor and production method thereof
DENSO CORP119 citations98
US6151966ANov 28, 2000
Semiconductor dynamical quantity sensor device having electrodes in Rahmen structure
DENSO CORP111 citations98
US6065341AMay 23, 2000
Semiconductor physical quantity sensor with stopper portion
DENSO CORP130 citations98
US6287885B1Sep 11, 2001
Method for manufacturing semiconductor dynamic quantity sensor
DENSO CORP84 citations97
US6255741B1Jul 3, 2001
Semiconductor device with a protective sheet to affix a semiconductor chip
DENSO CORP150 citations97
US6591678B2Jul 15, 2003
Semiconductor dynamic quantity sensor for detecting dynamic quantity in two axes with X-shaped mass portion
DENSO CORP69 citations96
US6450029B1Sep 17, 2002
Capacitive physical quantity detection device
DENSO CORP61 citations96
US6423563B2Jul 23, 2002
Method for manufacturing semiconductor dynamic quantity sensor
DENSO CORP77 citations96
US6388279B1May 14, 2002
Semiconductor substrate manufacturing method, semiconductor pressure sensor and manufacturing method thereof
DENSO CORP70 citations96
US6199430B1Mar 13, 2001
Acceleration sensor with ring-shaped movable electrode
DENSO CORP77 citations96
US7197939B2Apr 3, 2007
Pressure sensor
DENSO CORP20 citations93
US6990864B2Jan 31, 2006
Semiconductor dynamic quantity sensor
DENSO CORP25 citations93
US6973829B2Dec 13, 2005
Semiconductor dynamic quantity sensor with movable electrode and fixed electrode supported by support substrate
DENSO CORP20 citations93
US6250165B1Jun 26, 2001
Semiconductor physical quantity sensor
DENSO CORP50 citations93
US6169316B1Jan 2, 2001
Semiconductor pressure sensor including sensor chip fixed to package by adhesive
DENSO CORP34 citations93
US7243545B2Jul 17, 2007
Physical quantity sensor having spring
DENSO CORP25 citations92
US7059190B2Jun 13, 2006
Semiconductor dynamic sensor having variable capacitor formed on laminated substrate
DENSO CORP35 citations92
US6444543B2Sep 3, 2002
Semiconductor sensor device and method of manufacturing the same
DENSO CORP23 citations92
US6450031B1Sep 17, 2002
Semiconductor physical quantity sensor
DENSO CORP41 citations91
US6508126B2Jan 21, 2003
Dynamic quantity sensor having movable and fixed electrodes with high rigidity
DENSO CORP48 citations90
US7007550B2Mar 7, 2006
Semiconductor dynamic quantity sensor
DENSO CORP17 citations84
US6792805B2Sep 21, 2004
Capacitive acceleration sensor
DENSO CORP14 citations84
US7327004B2Feb 5, 2008
Sensor device
DENSO CORP19 citations83
US7004029B2Feb 28, 2006
Semiconductor dynamic quantity sensor
DENSO CORP8 citations74
US6973844B2Dec 13, 2005
Semiconductor mechanical quantity sensor
DENSO CORP7 citations74
US6906394B2Jun 14, 2005
Method of manufacturing semiconductor device capable of sensing dynamic quantity
DENSO CORP6 citations74
US6848309B2Feb 1, 2005
Capacitive type dynamic quantity sensor
DENSO CORP10 citations74
US6841840B2Jan 11, 2005
Capacitive dynamic quantity sensor
DENSO CORP9 citations74
US6753201B2Jun 22, 2004
Method of manufacturing semiconductor device capable of sensing dynamic quantity
DENSO CORP11 citations74
US6672161B2Jan 6, 2004
Semiconductor dynamic quantity sensor
DENSO CORP7 citations74
US6502462B2Jan 7, 2003
Capacitance type dynamic quantity sensor having displacement portion and formed by wire bonding
DENSO CORP11 citations74
US5932921AAug 3, 1999
Sensor chip having a diode portions and a thin-wall portion
DENSO CORP11 citations74
US6194236B1Feb 27, 2001
Electrochemical etching method for silicon substrate having PN junction
DENSO CORP5 citations73
US6785117B2Aug 31, 2004
Capacitive device
DENSO CORP10 citations72
US9791472B2Oct 17, 2017
Acceleration sensor
DENSO CORP2 citations71
US6020618AFeb 1, 2000
Semiconductor device in which thin silicon portions are formed by electrochemical stop etching method
DENSO CORP13 citations71
US10001375B2Jun 19, 2018
Sensor device
DENSO CORP2 citations68
US7622781B2Nov 24, 2009
Semiconductor dynamic quantity sensor
DENSO CORP2 citations63
NIPPON DENSO CO
8 patentsUS5017979AMay 21, 1991
EEPROM semiconductor memory device
NIPPON DENSO CO41 citations96
US4975390ADec 4, 1990
Method of fabricating a semiconductor pressure sensor
NIPPON DENSO CO125 citations96
US5470771ANov 28, 1995
Method of manufacturing a floating gate memory device
NIPPON DENSO CO32 citations93
US5949118ASep 7, 1999
Etching method for silicon substrates and semiconductor sensor
NIPPON DENSO CO30 citations92
US5654244AAug 5, 1997
Process for producing semiconductor strain-sensitive sensor
NIPPON DENSO CO34 citations92
US5643803AJul 1, 1997
Production method of a semiconductor dynamic sensor
NIPPON DENSO CO30 citations92
US5549785AAug 27, 1996
Method of producing a semiconductor dynamic sensor
NIPPON DENSO CO20 citations92
US5063423ANov 5, 1991
Semiconductor memory device of a floating gate tunnel oxide type
NIPPON DENSO CO21 citations82
SAKAI MINEKAZU
3 patentsShowing the top 50 of 75 patents by PatentIndex Score.