Inventor

KOBATAKE HIROYUKI

JP52 patents

⚠️ This page may combine multiple inventors who share the name “KOBATAKE HIROYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KOBATAKE HIROYUKI

NEC CORP

Read only semiconductor memory having multiple bit cells

Constant voltage generating circuit having step-up circuit

Programmable read only memory with means for discharging bit line before program verifying operation

Reference voltage generation circuit providing a stable output voltage

Nonvolatile semiconductor storage including main decoder with predecoder

Method and Nonvolatile semiconductor memory for repairing over-erased cells

Non-volatile semiconductor memory device

High voltage CMOS circuit which protects the gate oxides from excessive voltages

Charge pump having pull-up circuit operating with two clock pulse sequences

Power source circuit for generating positive and negative voltage sources

Read-only semiconductor memory device

Nonvolatile semiconductor memory device having a program area

Semiconductor device having an integrated differential circuit with an improved common-mode rejection ratio (CMRR)

High speed and high accuracy A/D converter

Digital to analog converter having a string of resistors

Chopper type differential amplifier using MOS gate capacitors

Semiconductor device with reduced noise propagation between circuit blocks

Current controller

Erasable programmable read only memory

High speed booster circuit

Delay circuit having stable delay time

Memory element exchange control circuit capable of automatically refreshing a defective address

Non-volatile semiconductor memory including a high voltage switching circuit

Input circuit incorporated in a semiconductor device

Circuit arrangement of sense amplifier for rapid evaluation of logic state

Circuit for detecting level of input voltage

Semiconductor memory device

Non-volatile semiconductor memory device for selective cell flash erasing/programming

Semiconductor device with plural power supply circuits, plural internal circuits, and single external terminal

Non-volatile semiconductor storage device selecting bit lines on voltage divided from word line selection voltage

Test method and circuit for semiconductor memory

Nonvolatile semiconductor memory device having test circuit for testing erasing function thereof

Semiconductor storage device

Voltage divider for high-speed high-precision signal converting unit

Control circuit for multipurpose input terminal

Semiconductor circuit having circuit supplying voltage higher than power supply voltage

KOBATAKE HIROYUKI

Static random access memory (SRAM) and test method of the SRAM having precharge circuit to prepcharge bit line

Differential sense amplifier

Semiconductor integrated circuit and method of testing the same

Semiconductor storage device

Semiconductor device

Test circuit and test method for testing differential input circuit

Static random access memory (SRAM) and test method of the SRAM having precharge circuit to precharge bit line

SRAM and testing method of SRAM

RENESAS ELECTRONICS CORP

Semiconductor device having memory cell with electrostatic capacitance circuit

Semiconductor storage device

Fuse data read circuit having control circuit between fuse and current mirror circuit

NEC ELECTRONICS CORP

Semiconductor integrated circuit device and inspection method of the same

KODAMA NORIAKI

Non-volatile semiconductor memory device

NEC CORPORATOIN

Semiconductor device having device supplying voltage higher than power supply voltage