Inventor
KOBAYASHI MAMORU
JP36 patents
⚠️ This page may combine multiple inventors who share the name “KOBAYASHI MAMORU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
10 patentsUS5231585AJul 27, 1993
Computer-integrated manufacturing system and method
HITACHI LTD149 citations97
US4871110AOct 3, 1989
Method and apparatus for aligning solder balls
HITACHI LTD151 citations96
US4608494AAug 26, 1986
Component alignment apparatus
HITACHI LTD73 citations96
US5329690AJul 19, 1994
Printed circuit board assembling system
HITACHI LTD56 citations94
US4437603AMar 20, 1984
Automatic wiring machine for printed circuit boards
HITACHI LTD75 citations93
US5906309AMay 25, 1999
Solder bump measuring method and apparatus
HITACHI LTD15 citations82
US4672209AJun 9, 1987
Component alignment method
HITACHI LTD20 citations82
US6340109B2Jan 22, 2002
Solder bump measuring method and apparatus
HITACHI LTD5 citations74
US5023407AJun 11, 1991
Printed circuit board with a uniform conductive layer formed by equalization of metals therein
HITACHI LTD6 citations74
US6196441B1Mar 6, 2001
Solder bump measuring method and apparatus
HITACHI LTD3 citations63
SEIKO EPSON CORP
5 patentsUS6243645B1Jun 5, 2001
Audio-video output device and car navigation system
SEIKO EPSON CORP197 citations97
US6115084ASep 5, 2000
Projection-type display apparatus
SEIKO EPSON CORP16 citations91
US5973661AOct 26, 1999
Image display device which staggers the serial input data onto multiple drive lines and extends the time per data point
SEIKO EPSON CORP41 citations91
US5905540AMay 18, 1999
Projection-type display apparatus
SEIKO EPSON CORP17 citations91
US7213922B2May 8, 2007
Projector
SEIKO EPSON CORP15 citations84
HITACHI HIGH TECH CORP
5 patentsUS7719671B2May 18, 2010
Foreign matter inspection method and foreign matter inspection apparatus
HITACHI HIGH TECH CORP3 citations62
US10466181B2Nov 5, 2019
Flaw inspection device and flaw inspection method
HITACHI HIGH TECH CORP1 citations61
US9964500B2May 8, 2018
Defect inspection device, display device, and defect classification device
HITACHI HIGH TECH CORP0 citations51
US7986405B2Jul 26, 2011
Foreign matter inspection method and foreign matter inspection apparatus
HITACHI HIGH TECH CORP0 citations51
US10816484B2Oct 27, 2020
Flaw inspection device and flaw inspection method
HITACHI HIGH TECH CORP0 citations50