Inventor

VENGERTSEV DMITRY A

US2 patents

Patents

2 patents

US9690898B2Jun 27, 2017

Generative learning for realistic and ground rule clean hot spot synthesis

GLOBALFOUNDRIES INC13 citations79

US10146036B2Dec 4, 2018

Semiconductor wafer inspection using care area group-specific threshold settings for detecting defects

GLOBALFOUNDRIES INC1 citations45