Inventor
FAERBER GERRIT
DE2 patents
Patents
2 patentsUS6992498B2Jan 31, 2006
Test apparatus for testing integrated modules and method for operating a test apparatus
INFINEON TECHNOLOGIES AG2 citations55
US6773934B2Aug 10, 2004
Method for releasable contact-connection of a plurality of integrated semiconductor modules on a wafer
INFINEON TECHNOLOGIES AG0 citations38