Inventor

GARRETSON OLIVER R

3 patents

⚠️ This page may combine multiple inventors who share the name “GARRETSON OLIVER R”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

JAPAN ELECTRONIC MATERIALS

1 patent

US4518914AMay 21, 1985

Testing apparatus of semiconductor wafers

JAPAN ELECTRONIC MATERIALS61 citations93

ANGLIATECH LIMITED

1 patent

US4623839ANov 18, 1986

Probe device for testing an integrated circuit

ANGLIATECH LIMITED48 citations82

XYNETICS INC

1 patent

US3952410AApr 27, 1976

Probe card including a multiplicity of probe contacts and method of making

XYNETICS INC25 citations75