Inventor

PELZ JONATHAN P

US2 patents

Patents

2 patents

US6856145B2Feb 15, 2005

Direct, low frequency capacitance measurement for scanning capacitance microscopy

UNIV OHIO STATE12 citations81

US7023220B2Apr 4, 2006

Method for measuring nm-scale tip-sample capacitance

UNIV OHIO STATE5 citations71