Inventor
BEN-PORATH ARIEL
IL10 patents
⚠️ This page may combine multiple inventors who share the name “BEN-PORATH ARIEL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS INC
6 patentsUS6922482B1Jul 26, 2005
Hybrid invariant adaptive automatic defect classification
APPLIED MATERIALS INC86 citations97
US6987873B1Jan 17, 2006
Automatic defect classification with invariant core classes
APPLIED MATERIALS INC57 citations96
US6670610B2Dec 30, 2003
System and method for directing a miller
APPLIED MATERIALS INC58 citations94
US7760929B2Jul 20, 2010
Grouping systematic defects with feedback from electrical inspection
APPLIED MATERIALS INC42 citations89
US7760347B2Jul 20, 2010
Design-based method for grouping systematic defects in lithography pattern writing system
APPLIED MATERIALS INC22 citations89
US6673657B2Jan 6, 2004
Kill index analysis for automatic defect classification in semiconductor wafers
APPLIED MATERIALS INC3 citations61
APPLIED MATERIALS ISRAEL LTD
3 patentsUS7217579B2May 15, 2007
Voltage contrast test structure
APPLIED MATERIALS ISRAEL LTD91 citations92
US7135344B2Nov 14, 2006
Design-based monitoring
APPLIED MATERIALS ISRAEL LTD62 citations90
US7587700B2Sep 8, 2009
Process monitoring system and method for processing a large number of sub-micron measurement targets
APPLIED MATERIALS ISRAEL LTD2 citations57