P

Inventor

ZETTLER THOMAS

DE45 patents
⚠️ This page may combine multiple inventors who share the name “ZETTLER THOMAS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INFINEON TECHNOLOGIES AG

27 patents
US8028179B2Sep 27, 2011

Determining expected exceeding of maximum allowed power consumption of a mobile electronic device

INFINEON TECHNOLOGIES AG8 citations84
US7233161B2Jun 19, 2007

Integrated circuit and associated packaged integrated circuit having an integrated marking apparatus

INFINEON TECHNOLOGIES AG7 citations74
US6397467B1Jun 4, 2002

Ink jet print head and method of producing the ink print head

INFINEON TECHNOLOGIES AG9 citations74
US6137315AOct 24, 2000

Drive circuit for a non-volatile semiconductor storage configuration

INFINEON TECHNOLOGIES AG12 citations74
US10931314B2Feb 23, 2021

Method and apparatus for providing a joint error correction code for a combined data frame comprising first data of a first data channel and second data of a second data channel and sensor system

INFINEON TECHNOLOGIES AG1 citations73
US10641809B2May 5, 2020

Sensor device, evaluation device and corresponding systems and methods

INFINEON TECHNOLOGIES AG2 citations73
US10298271B2May 21, 2019

Method and apparatus for providing a joint error correction code for a combined data frame comprising first data of a first data channel and second data of a second data channel and sensor system

INFINEON TECHNOLOGIES AG3 citations73
US10511667B2Dec 17, 2019

CAR2X communication system, apparatus and method

INFINEON TECHNOLOGIES AG2 citations72
US10163763B1Dec 25, 2018

Integrated circuit package with multi-die communication

INFINEON TECHNOLOGIES AG2 citations72
US10042693B2Aug 7, 2018

Diverse integrated processing using processors and diverse firmware

INFINEON TECHNOLOGIES AG2 citations72
US11733288B2Aug 22, 2023

Circuits and techniques for assessing aging effects in semiconductor circuits

INFINEON TECHNOLOGIES AG3 citations71
US11609265B1Mar 21, 2023

End-of-life prediction for circuits using accelerated reliability models and sensor data

INFINEON TECHNOLOGIES AG2 citations71
US11669384B2Jun 6, 2023

Diverse integrated processing using processors and diverse firmware

INFINEON TECHNOLOGIES AG0 citations62
US11438017B2Sep 6, 2022

Method and apparatus for providing a joint error correction code for a combined data frame comprising first data of a first data channel and second data of a second data channel and sensor system

INFINEON TECHNOLOGIES AG0 citations62
US11188410B2Nov 30, 2021

Diverse integrated processing using processors and diverse firmware

INFINEON TECHNOLOGIES AG0 citations62
US10289508B2May 14, 2019

Sensor system and method for identifying faults related to a substrate

INFINEON TECHNOLOGIES AG1 citations62
US12254254B2Mar 18, 2025

Circuits and techniques for predicting failure of circuits based on stress origination metrics and stress victim events

INFINEON TECHNOLOGIES AG0 citations61
US10281517B2May 7, 2019

Semiconductor chip with fracture detection

INFINEON TECHNOLOGIES AG1 citations61
US7707529B2Apr 27, 2010

Method for the computer-aided ascertainment of a clock tree structure, and integrated semiconductor circuit

INFINEON TECHNOLOGIES AG3 citations54
US10228403B2Mar 12, 2019

Sensor device, evaluation device and corresponding systems and methods

INFINEON TECHNOLOGIES AG0 citations52
US7424657B2Sep 9, 2008

Method and device for testing an integrated circuit, integrated circuit to be tested, and wafer with a large number of integrated circuits to be tested

INFINEON TECHNOLOGIES AG1 citations52
US10705132B2Jul 7, 2020

Semiconductor chip with fracture detection

INFINEON TECHNOLOGIES AG0 citations51
US10606686B2Mar 31, 2020

Diverse integrated processing using processors and diverse firmware

INFINEON TECHNOLOGIES AG0 citations51
US12352802B2Jul 8, 2025

Circuits and techniques for predicting end of life based on in situ monitors and limit values defined for the in situ monitors

INFINEON TECHNOLOGIES AG0 citations50
US11821935B2Nov 21, 2023

Differential aging monitor circuits and techniques for assessing aging effects in semiconductor circuits

INFINEON TECHNOLOGIES AG0 citations50
US10229805B2Mar 12, 2019

Detection of dependent failures

INFINEON TECHNOLOGIES AG0 citations50
US7304879B2Dec 4, 2007

Non-volatile memory element capable of storing irreversible complementary data

INFINEON TECHNOLOGIES AG0 citations42

SIEMENS AG

12 patents

CLAUSEN AXEL

2 patents

ZETTLER THOMAS

1 patent

LAYTEC GMBH

1 patent

SIGGELKOW ANDREAS

1 patent

BJARNASON ELIAS

1 patent