Inventor
ZETTLER THOMAS
DE45 patents
⚠️ This page may combine multiple inventors who share the name “ZETTLER THOMAS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INFINEON TECHNOLOGIES AG
27 patentsUS8028179B2Sep 27, 2011
Determining expected exceeding of maximum allowed power consumption of a mobile electronic device
INFINEON TECHNOLOGIES AG8 citations84
US7233161B2Jun 19, 2007
Integrated circuit and associated packaged integrated circuit having an integrated marking apparatus
INFINEON TECHNOLOGIES AG7 citations74
US6397467B1Jun 4, 2002
Ink jet print head and method of producing the ink print head
INFINEON TECHNOLOGIES AG9 citations74
US6137315AOct 24, 2000
Drive circuit for a non-volatile semiconductor storage configuration
INFINEON TECHNOLOGIES AG12 citations74
US10931314B2Feb 23, 2021
Method and apparatus for providing a joint error correction code for a combined data frame comprising first data of a first data channel and second data of a second data channel and sensor system
INFINEON TECHNOLOGIES AG1 citations73
US10641809B2May 5, 2020
Sensor device, evaluation device and corresponding systems and methods
INFINEON TECHNOLOGIES AG2 citations73
US10298271B2May 21, 2019
Method and apparatus for providing a joint error correction code for a combined data frame comprising first data of a first data channel and second data of a second data channel and sensor system
INFINEON TECHNOLOGIES AG3 citations73
US10511667B2Dec 17, 2019
CAR2X communication system, apparatus and method
INFINEON TECHNOLOGIES AG2 citations72
US10163763B1Dec 25, 2018
Integrated circuit package with multi-die communication
INFINEON TECHNOLOGIES AG2 citations72
US10042693B2Aug 7, 2018
Diverse integrated processing using processors and diverse firmware
INFINEON TECHNOLOGIES AG2 citations72
US11733288B2Aug 22, 2023
Circuits and techniques for assessing aging effects in semiconductor circuits
INFINEON TECHNOLOGIES AG3 citations71
US11609265B1Mar 21, 2023
End-of-life prediction for circuits using accelerated reliability models and sensor data
INFINEON TECHNOLOGIES AG2 citations71
US11669384B2Jun 6, 2023
Diverse integrated processing using processors and diverse firmware
INFINEON TECHNOLOGIES AG0 citations62
US11438017B2Sep 6, 2022
Method and apparatus for providing a joint error correction code for a combined data frame comprising first data of a first data channel and second data of a second data channel and sensor system
INFINEON TECHNOLOGIES AG0 citations62
US11188410B2Nov 30, 2021
Diverse integrated processing using processors and diverse firmware
INFINEON TECHNOLOGIES AG0 citations62
US10289508B2May 14, 2019
Sensor system and method for identifying faults related to a substrate
INFINEON TECHNOLOGIES AG1 citations62
US12254254B2Mar 18, 2025
Circuits and techniques for predicting failure of circuits based on stress origination metrics and stress victim events
INFINEON TECHNOLOGIES AG0 citations61
US10281517B2May 7, 2019
Semiconductor chip with fracture detection
INFINEON TECHNOLOGIES AG1 citations61
US7707529B2Apr 27, 2010
Method for the computer-aided ascertainment of a clock tree structure, and integrated semiconductor circuit
INFINEON TECHNOLOGIES AG3 citations54
US10228403B2Mar 12, 2019
Sensor device, evaluation device and corresponding systems and methods
INFINEON TECHNOLOGIES AG0 citations52
US7424657B2Sep 9, 2008
Method and device for testing an integrated circuit, integrated circuit to be tested, and wafer with a large number of integrated circuits to be tested
INFINEON TECHNOLOGIES AG1 citations52
US10705132B2Jul 7, 2020
Semiconductor chip with fracture detection
INFINEON TECHNOLOGIES AG0 citations51
US10606686B2Mar 31, 2020
Diverse integrated processing using processors and diverse firmware
INFINEON TECHNOLOGIES AG0 citations51
US12352802B2Jul 8, 2025
Circuits and techniques for predicting end of life based on in situ monitors and limit values defined for the in situ monitors
INFINEON TECHNOLOGIES AG0 citations50
US11821935B2Nov 21, 2023
Differential aging monitor circuits and techniques for assessing aging effects in semiconductor circuits
INFINEON TECHNOLOGIES AG0 citations50
US10229805B2Mar 12, 2019
Detection of dependent failures
INFINEON TECHNOLOGIES AG0 citations50
US7304879B2Dec 4, 2007
Non-volatile memory element capable of storing irreversible complementary data
INFINEON TECHNOLOGIES AG0 citations42
SIEMENS AG
12 patentsUS5611940AMar 18, 1997
Microsystem with integrated circuit and micromechanical component, and production process
SIEMENS AG102 citations98
US5637904AJun 10, 1997
Micromechanical component with a switch element as a movable structure, microsystem, and production process
SIEMENS AG22 citations92
US5600190AFeb 4, 1997
Micromechanical component part and method for the manufacture thereof
SIEMENS AG40 citations92
US5422309AJun 6, 1995
Method for producing a metallization level having contacts and interconnects connecting the contacts
SIEMENS AG45 citations91
US5930171AJul 27, 1999
Constant-current source with an EEPROM cell
SIEMENS AG10 citations74
US5602411AFeb 11, 1997
Micromechanical component with a dielectric movable structure, and microsystem
SIEMENS AG13 citations74
US6122199ASep 19, 2000
Semiconductor storage device
SIEMENS AG5 citations63
US6115286ASep 5, 2000
Data memory
SIEMENS AG3 citations63
US6099106AAug 8, 2000
Ink jet print head
SIEMENS AG5 citations63
US5824233AOct 20, 1998
Micromechanical component with a dielectric movable structure, microsystem, and production process
SIEMENS AG2 citations63
US6034902AMar 7, 2000
Solid-state memory device
SIEMENS AG6 citations62
US5946249AAug 31, 1999
Circuit configuration for a programmable nonvolatile memory and method for operating the circuit configuration
SIEMENS AG1 citations51