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Inventor
HASSAN ABU
US
2 patents
Patents
2 patents
US6966021B2
Nov 15, 2005
Method and apparatus for at-speed testing of digital circuits
RAJSKI JANUSZ
84 citations
96
US7437636B2
Oct 14, 2008
Method and apparatus for at-speed testing of digital circuits
RAJSKI JANUSZ
10 citations
82