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Inventor
ARAKI MINE
JP
2 patents
Patents
2 patents
US7705302B2
Apr 27, 2010
Scanning electron microscope
HITACHI HIGH TECH CORP
13 citations
81
US7459683B2
Dec 2, 2008
Charged particle beam device with DF-STEM image valuation method
HITACHI HIGH TECH CORP
3 citations
57