Inventor

WANG YING-YING

CN27 patents

⚠️ This page may combine multiple inventors who share the name “WANG YING-YING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

WANG YING-YING

TAIWAN SEMICONDUCTOR MFG CO LTD

Lithographic overlay sampling

Overlay sampling methodology

Lithographic overlay correction and lithographic process

Lithographic overlay correction and lithographic process

Overlay sampling methodology

Semiconductor manufacturing method and tool

Edge-dominant alignment method in exposure scanner system

Overlay metrology method

Semiconductor overlay production system and method

Overlay metrology method and overlay control method and system

Paired edge alignment

TAIWAN SEMICONDUCTOR MFG

Dry development process for a bi-layer resist system

Method of patterning narrow gate electrode

Method for improving conformity and contact bottom coverage of sputtered titanium nitride barrier layers

Dry development process for a bi-layer resist system utilized to reduce microloading

Semiconductor overlay production system and method

CHANG HSIN-PEI

Process for surface treating iron-based alloy and article

Coated article and method of making the same

Device housing and method for making the same

Coated article and method of making the same

Coated article and method of making the same

UNIV NORTH CAROLINA CHAPEL HILL

Compositions and methods for inhibiting pathogen infection

Compositions and methods for inhibiting pathogen infection

Compositions and methods for inhibiting pathogen infection

LEE YUNG-YAO

Lithography process

Tool induced shift reduction determination for overlay metrology

CHEN WEN-RONG

Coated article and method for making same