Inventor
ANCISO ADOLFO
US4 patents
Patents
4 patentsUS6927174B2Aug 9, 2005
Site-specific method for large area uniform thickness plan view transmission electron microscopy sample preparation
TEXAS INSTRUMENTS INC6 citations68
US6884362B2Apr 26, 2005
Mass production of cross-section TEM samples by focused ion beam deposition and anisotropic etching
TEXAS INSTRUMENTS INC3 citations57
US6786978B2Sep 7, 2004
Mass production of cross-section TEM samples by focused ion beam deposition and anisotropic etching
TEXAS INSTRUMENTS INC2 citations57
US7262409B2Aug 28, 2007
Chemical etch solution and technique for imaging a device's shallow junction profile
TEXAS INSTRUMENTS INC0 citations29