Inventor
MCTEER ALLEN
US81 patents
⚠️ This page may combine multiple inventors who share the name “MCTEER ALLEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
46 patentsUS6800504B2Oct 5, 2004
Integrated circuit device and fabrication using metal-doped chalcogenide materials
MICRON TECHNOLOGY INC251 citations99
US6455424B1Sep 24, 2002
Selective cap layers over recessed polysilicon plugs
MICRON TECHNOLOGY INC124 citations99
US5939788AAug 17, 1999
Copper diffusion barrier, aluminum wetting layer and improved methods for filling openings in silicon substrates with cooper
MICRON TECHNOLOGY INC156 citations99
US6730547B2May 4, 2004
Integrated circuit device and fabrication using metal-doped chalcogenide materials
MICRON TECHNOLOGY INC60 citations96
US6709958B2Mar 23, 2004
Integrated circuit device and fabrication using metal-doped chalcogenide materials
MICRON TECHNOLOGY INC61 citations96
US6204179B1Mar 20, 2001
Copper diffusion barrier, aluminum wetting layer and improved methods for filling openings in silicon substrates with copper
MICRON TECHNOLOGY INC61 citations96
US5838052ANov 17, 1998
Reducing reflectivity on a semiconductor wafer by annealing titanium and aluminum
MICRON TECHNOLOGY INC46 citations96
US5700718ADec 23, 1997
Method for increased metal interconnect reliability in situ formation of titanium aluminide
MICRON TECHNOLOGY INC52 citations96
US7723713B2May 25, 2010
Layered resistance variable memory device and method of fabrication
MICRON TECHNOLOGY INC14 citations93
US7592212B2Sep 22, 2009
Methods for determining a dose of an impurity implanted in a semiconductor substrate
MICRON TECHNOLOGY INC19 citations93
US7087919B2Aug 8, 2006
Layered resistance variable memory device and method of fabrication
MICRON TECHNOLOGY INC28 citations93
US7061111B2Jun 13, 2006
Interconnect structure for use in an integrated circuit
MICRON TECHNOLOGY INC29 citations93
US6841478B2Jan 11, 2005
Method of forming a multi-layered copper bond pad for an integrated circuit
MICRON TECHNOLOGY INC14 citations93
US6642623B2Nov 4, 2003
Multi-layered copper bond pad for an integrated circuit
MICRON TECHNOLOGY INC16 citations93
US6373137B1Apr 16, 2002
Copper interconnect for an integrated circuit and methods for its fabrication
MICRON TECHNOLOGY INC30 citations93
US6261947B1Jul 17, 2001
Formation of electrical contacts to conductive elements in the fabrication of semiconductor integrated circuits
MICRON TECHNOLOGY INC30 citations93
US6204166B1Mar 20, 2001
Method for forming dual damascene structures
MICRON TECHNOLOGY INC22 citations93
US7749849B2Jul 6, 2010
Methods of selectively oxidizing semiconductor structures, and structures resulting therefrom
MICRON TECHNOLOGY INC16 citations92
US7737010B2Jun 15, 2010
Method of photoresist strip for plasma doping process of semiconductor manufacturing
MICRON TECHNOLOGY INC22 citations92
US6890790B2May 10, 2005
Co-sputter deposition of metal-doped chalcogenides
MICRON TECHNOLOGY INC26 citations92
US6348403B1Feb 19, 2002
Suppression of hillock formation in thin aluminum films
MICRON TECHNOLOGY INC24 citations92
US6110830AAug 29, 2000
Methods of reducing corrosion of materials, methods of protecting aluminum within aluminum-comprising layers from electrochemical degradation during semiconductor processing methods of forming aluminum-comprising lines
MICRON TECHNOLOGY INC33 citations92
US8981334B1Mar 17, 2015
Memory cells having regions containing one or both of carbon and boron
MICRON TECHNOLOGY INC10 citations84
US9093367B2Jul 28, 2015
Methods of forming doped regions in semiconductor substrates
MICRON TECHNOLOGY INC11 citations82
US7476556B2Jan 13, 2009
Systems and methods for plasma processing of microfeature workpieces
MICRON TECHNOLOGY INC5 citations74
US7364644B2Apr 29, 2008
Silver selenide film stoichiometry and morphology control in sputter deposition
MICRON TECHNOLOGY INC5 citations74
US7205223B2Apr 17, 2007
Method of forming an interconnect structure for a semiconductor device
MICRON TECHNOLOGY INC5 citations74
US7138290B2Nov 21, 2006
Methods of depositing silver onto a metal selenide-comprising surface and methods of depositing silver onto a selenium-comprising surface
MICRON TECHNOLOGY INC8 citations74
US7078755B2Jul 18, 2006
Memory cell with selective deposition of refractory metals
MICRON TECHNOLOGY INC6 citations74
US7049009B2May 23, 2006
Silver selenide film stoichiometry and morphology control in sputter deposition
MICRON TECHNOLOGY INC6 citations74
US6858465B2Feb 22, 2005
Elimination of dendrite formation during metal/chalcogenide glass deposition
MICRON TECHNOLOGY INC7 citations74
US6825135B2Nov 30, 2004
Elimination of dendrite formation during metal/chalcogenide glass deposition
MICRON TECHNOLOGY INC9 citations74
US6522010B2Feb 18, 2003
Semiconductor constructions comprising aluminum-containing layers
MICRON TECHNOLOGY INC6 citations74
US6384480B1May 7, 2002
Formation of electrical contacts to conductive elements in the fabrication of semiconductor integrated circuits
MICRON TECHNOLOGY INC13 citations74
US6339026B1Jan 15, 2002
Semiconductor processing methods of polishing aluminum-comprising layers
MICRON TECHNOLOGY INC6 citations74
US6277746B1Aug 21, 2001
Methods of reducing corrosion of materials, methods of protecting aluminum within aluminum-comprising layers from electrochemical degradation during semiconductor processing, and semicoductor processing methods of forming aluminum-comprising lines
MICRON TECHNOLOGY INC6 citations74
US6258466B1Jul 10, 2001
Metallization on titanium aluminide
MICRON TECHNOLOGY INC12 citations74
US6140701AOct 31, 2000
Suppression of hillock formation in thin aluminum films
MICRON TECHNOLOGY INC5 citations74
US6069075AMay 30, 2000
Reducing reflectivity on a semiconductor wafer by annealing aluminum and titanium
MICRON TECHNOLOGY INC10 citations74
US6016010AJan 18, 2000
Voidless metallization on titanium aluminide in an interconnect
MICRON TECHNOLOGY INC12 citations74
US11107823B2Aug 31, 2021
Integrated structures and methods of forming integrated structures
MICRON TECHNOLOGY INC2 citations73
US10504911B2Dec 10, 2019
Integrated structures and methods of forming integrated structures
MICRON TECHNOLOGY INC1 citations73
US10325917B2Jun 18, 2019
Integrated structures and methods of forming integrated structures
MICRON TECHNOLOGY INC1 citations73
US7446393B2Nov 4, 2008
Co-sputter deposition of metal-doped chalcogenides
MICRON TECHNOLOGY INC5 citations73
US7202104B2Apr 10, 2007
Co-sputter deposition of metal-doped chalcogenides
MICRON TECHNOLOGY INC4 citations73
US9786475B2Oct 10, 2017
Systems and methods for plasma processing of microfeature workpieces
MICRON TECHNOLOGY INC1 citations63
INTEL CORP
2 patentsCAMPBELL KRISTY A
1 patentQIN SHU
1 patentShowing the top 50 of 81 patents by PatentIndex Score.