Inventor

ONIZAWA AKIHIRO

JP4 patents

⚠️ This page may combine multiple inventors who share the name “ONIZAWA AKIHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HITACHI HIGH TECH CORP

2 patents

US7732792B2Jun 8, 2010

Pattern measurement apparatus

HITACHI HIGH TECH CORP23 citations92

US10545018B2Jan 28, 2020

Pattern measurement device, and computer program for measuring pattern

HITACHI HIGH TECH CORP1 citations59

MATSUOKA RYOICHI

1 patent

US8445871B2May 21, 2013

Pattern measurement apparatus

MATSUOKA RYOICHI6 citations82

MIYAMOTO ATSUSHI

1 patent

US9057873B2Jun 16, 2015

Global alignment using multiple alignment pattern candidates

MIYAMOTO ATSUSHI2 citations59