P

Inventor

MIYAMOTO HIROSHI

JP142 patents
⚠️ This page may combine multiple inventors who share the name “MIYAMOTO HIROSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MITSUBISHI ELECTRIC CORP

22 patents
US5574729ANov 12, 1996

Redundancy circuit for repairing defective bits in semiconductor memory device

MITSUBISHI ELECTRIC CORP63 citations96
US5357478AOct 18, 1994

Semiconductor integrated circuit device including a plurality of cell array blocks

MITSUBISHI ELECTRIC CORP97 citations96
US5587607ADec 24, 1996

Semiconductor integrated circuit device having improvement arrangement of pads

MITSUBISHI ELECTRIC CORP37 citations93
US5204837AApr 20, 1993

Semiconductor memory device having test mode

MITSUBISHI ELECTRIC CORP34 citations93
US5073874ADec 17, 1991

Method of and apparatus for reducing current of semiconductor memory device

MITSUBISHI ELECTRIC CORP25 citations93
US4984054AJan 8, 1991

Electric fuse for a redundancy circuit

MITSUBISHI ELECTRIC CORP38 citations93
US4974053ANov 27, 1990

Semiconductor device for multiple packaging configurations

MITSUBISHI ELECTRIC CORP34 citations93
US4933902AJun 12, 1990

Method of and apparatus for reducing current of semiconductor memory device

MITSUBISHI ELECTRIC CORP32 citations93
US4855613AAug 8, 1989

Wafer scale integration semiconductor device having improved chip power-supply connection arrangement

MITSUBISHI ELECTRIC CORP27 citations93
US4788455ANov 29, 1988

CMOS reference voltage generator employing separate reference circuits for each output transistor

MITSUBISHI ELECTRIC CORP33 citations93
US4780850AOct 25, 1988

CMOS dynamic random access memory

MITSUBISHI ELECTRIC CORP45 citations93
US5586076ADec 17, 1996

Semiconductor memory device permitting high speed data transfer and high density integration

MITSUBISHI ELECTRIC CORP40 citations92
US5384784AJan 24, 1995

Semiconductor memory device comprising a test circuit and a method of operation thereof

MITSUBISHI ELECTRIC CORP42 citations92
US5323348AJun 21, 1994

Semiconductor memory device having multiple memory arrays and including redundancy circuit for repairing a faulty bit

MITSUBISHI ELECTRIC CORP23 citations92
US5063313ANov 5, 1991

Delay circuit employing different threshold fet's

MITSUBISHI ELECTRIC CORP25 citations92
US4931668AJun 5, 1990

MIS transistor driven inverter circuit capable of individually controlling rising portion and falling portion of output waveform

MITSUBISHI ELECTRIC CORP26 citations92
US5729502AMar 17, 1998

Semiconductor memory device that can read out data at high speed

MITSUBISHI ELECTRIC CORP16 citations82
US5337272AAug 9, 1994

Circuit for applying selected voltages to dynamic random access memory

MITSUBISHI ELECTRIC CORP17 citations82
US5111078AMay 5, 1992

Input circuit for logic circuit having node and operating method therefor

MITSUBISHI ELECTRIC CORP20 citations82
US5111433AMay 5, 1992

Semiconductor memory device with inhibiting test mode cancellation and operating method thereof

MITSUBISHI ELECTRIC CORP19 citations82
US5600607AFeb 4, 1997

Semiconductor memory device that can read out data at high speed

MITSUBISHI ELECTRIC CORP7 citations74
US5448516ASep 5, 1995

Semiconductor memory device suitable for high integration

MITSUBISHI ELECTRIC CORP18 citations74

TOYOTA MOTOR CO LTD

9 patents

MIYAMOTO HIROSHI

4 patents

SONY CORP

2 patents

YAZAKI CORP

2 patents

FUJI XEROX CO LTD

2 patents

IWAZAKI YASUSHI

2 patents

SAWADA HIROSHI

2 patents

HITACHI LTD

2 patents

OPTICAL MEASUREMENT TECHNOLOGY

1 patent

TOKYO SEIMITSU CO LTD

1 patent

CANON KK

1 patent

Showing the top 50 of 142 patents by PatentIndex Score.