Inventor
HONG CHEONG MIN
US50 patents
⚠️ This page may combine multiple inventors who share the name “HONG CHEONG MIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FREESCALE SEMICONDUCTOR INC
20 patentsUS8901632B1Dec 2, 2014
Non-volatile memory (NVM) and high-K and metal gate integration using gate-last methodology
FREESCALE SEMICONDUCTOR INC40 citations94
US8969940B1Mar 3, 2015
Method of gate strapping in split-gate memory cell with inlaid gate
FREESCALE SEMICONDUCTOR INC21 citations92
US9437500B1Sep 6, 2016
Method of forming supra low threshold devices
FREESCALE SEMICONDUCTOR INC8 citations84
US9275864B2Mar 1, 2016
Method to form a polysilicon nanocrystal thin film storage bitcell within a high k metal gate platform technology using a gate last process to form transistor gates
FREESCALE SEMICONDUCTOR INC19 citations84
US9142566B2Sep 22, 2015
Method of forming different voltage devices with high-K metal gate
FREESCALE SEMICONDUCTOR INC10 citations84
US9129855B2Sep 8, 2015
Non-volatile memory (NVM) and high-k and metal gate integration using gate-first methodology
FREESCALE SEMICONDUCTOR INC7 citations84
US8853027B2Oct 7, 2014
Split gate flash cell
FREESCALE SEMICONDUCTOR INC9 citations84
US9653164B2May 16, 2017
Method for integrating non-volatile memory cells with static random access memory cells and logic transistors
FREESCALE SEMICONDUCTOR INC8 citations82
US7838922B2Nov 23, 2010
Electronic device including trenches and discontinuous storage elements
FREESCALE SEMICONDUCTOR INC9 citations82
US7572699B2Aug 11, 2009
Process of forming an electronic device including fins and discontinuous storage elements
FREESCALE SEMICONDUCTOR INC10 citations82
US9368499B2Jun 14, 2016
Method of forming different voltage devices with high-k metal gate
FREESCALE SEMICONDUCTOR INC5 citations73
US7651916B2Jan 26, 2010
Electronic device including trenches and discontinuous storage elements and processes of forming and using the same
FREESCALE SEMICONDUCTOR INC7 citations72
US9548314B1Jan 17, 2017
Method of making a non-volatile memory (NVM) with trap-up reduction
FREESCALE SEMICONDUCTOR INC2 citations67
US8048738B1Nov 1, 2011
Method for forming a split gate device
FREESCALE SEMICONDUCTOR INC3 citations63
US7871886B2Jan 18, 2011
Nanocrystal memory with differential energy bands and method of formation
FREESCALE SEMICONDUCTOR INC4 citations63
US9847397B2Dec 19, 2017
Method of forming split gate memory with improved reliability
FREESCALE SEMICONDUCTOR INC0 citations52
US9559178B2Jan 31, 2017
Non-volatile memory (NVM) cell and device structure integration
FREESCALE SEMICONDUCTOR INC1 citations52
US9331092B2May 3, 2016
Methods for forming contact landing regions in split-gate non-volatile memory (NVM) cell arrays
FREESCALE SEMICONDUCTOR INC0 citations52
US9397201B2Jul 19, 2016
Non-volatile memory (NVM) cell and a method of making
FREESCALE SEMICONDUCTOR INC0 citations51
US10026820B2Jul 17, 2018
Split gate device with doped region and method therefor
FREESCALE SEMICONDUCTOR INC0 citations42
HONG CHEONG MIN
11 patentsUS8932925B1Jan 13, 2015
Split-gate non-volatile memory (NVM) cell and device structure integration
HONG CHEONG MIN17 citations83
US9111639B2Aug 18, 2015
Biasing split gate memory cell during power-off mode
HONG CHEONG MIN6 citations72
US9076519B2Jul 7, 2015
Reram device structure
HONG CHEONG MIN2 citations62
US9006093B2Apr 14, 2015
Non-volatile memory (NVM) and high voltage transistor integration
HONG CHEONG MIN2 citations62
US9590058B2Mar 7, 2017
Methods and structures for a split gate memory cell structure
HONG CHEONG MIN0 citations52
US8953378B2Feb 10, 2015
Split gate programming
HONG CHEONG MIN0 citations52
US8860001B2Oct 14, 2014
ReRAM device structure
HONG CHEONG MIN0 citations52
US8163609B2Apr 24, 2012
Nanocrystal memory with differential energy bands and method of formation
HONG CHEONG MIN1 citations52
US9397176B2Jul 19, 2016
Method of forming split gate memory with improved reliability
HONG CHEONG MIN0 citations51
US9514945B2Dec 6, 2016
Nanocrystal memory and methods for forming same
HONG CHEONG MIN0 citations47
US9349453B2May 24, 2016
Semiconductor memory cell and driver circuitry with gate oxide formed simultaneously
HONG CHEONG MIN0 citations39
ZHOU FENG
4 patentsUS8779405B2Jul 15, 2014
Field focusing features in a ReRAM cell
ZHOU FENG4 citations73
US9118008B2Aug 25, 2015
Field focusing features in a ReRAM cell
ZHOU FENG2 citations62
US9114980B2Aug 25, 2015
Field focusing features in a ReRAM cell
ZHOU FENG3 citations62
US8921155B2Dec 30, 2014
Resistive random access memory (RAM) cell and method for forming
ZHOU FENG3 citations62
PERERA ASANGA H
3 patentsUS8877585B1Nov 4, 2014
Non-volatile memory (NVM) cell, high voltage transistor, and high-K and metal gate transistor integration
PERERA ASANGA H11 citations84
US9082650B2Jul 14, 2015
Integrated split gate non-volatile memory cell and logic structure
PERERA ASANGA H7 citations83
US9252246B2Feb 2, 2016
Integrated split gate non-volatile memory cell and logic device
PERERA ASANGA H2 citations62