Inventor
KAWAHARA ATSUSHI
JP38 patents
⚠️ This page may combine multiple inventors who share the name “KAWAHARA ATSUSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NIPPON KOGAKU KK
15 patentsUS4758883AJul 19, 1988
Electronic picture camera with reduced memory capacity
NIPPON KOGAKU KK173 citations98
US4342905AAug 3, 1982
Automatic focusing device of a microscope
NIPPON KOGAKU KK118 citations96
US4696021ASep 22, 1987
Solid-state area imaging device having interline transfer CCD means
NIPPON KOGAKU KK43 citations92
US4614977ASep 30, 1986
Still picture signal conversion apparatus capable of trimming operation
NIPPON KOGAKU KK30 citations92
US4566037AJan 21, 1986
Solid-state area imaging apparatus
NIPPON KOGAKU KK56 citations92
US4506382AMar 19, 1985
Apparatus for detecting two-dimensional pattern and method for transforming the pattern into binary image
NIPPON KOGAKU KK45 citations92
US4479145AOct 23, 1984
Apparatus for detecting the defect of pattern
NIPPON KOGAKU KK44 citations92
US4472741ASep 18, 1984
Solid-state area imaging device
NIPPON KOGAKU KK31 citations92
US4692815ASep 8, 1987
Photographing and recording method and apparatus for electronic still picture cameras
NIPPON KOGAKU KK20 citations82
US4318886AMar 9, 1982
Automatic HLA typing apparatus
NIPPON KOGAKU KK20 citations82
US4000399ADec 28, 1976
Pattern counting system using line scanning
NIPPON KOGAKU KK14 citations74
US3980870ASep 14, 1976
Device for measuring contour length of a two-dimensional pattern
NIPPON KOGAKU KK15 citations74
US4472738ASep 18, 1984
Pattern testing apparatus
NIPPON KOGAKU KK8 citations73
US4311904AJan 19, 1982
Automatic focus adjusting device
NIPPON KOGAKU KK16 citations70
US4587416AMay 6, 1986
Focus detecting apparatus for microscope or camera
NIPPON KOGAKU KK3 citations63
CANON KK
7 patentsUS6236447B1May 22, 2001
Exposure method and apparatus, and semiconductor device manufactured using the method
CANON KK30 citations93
US6163369ADec 19, 2000
Plane position detecting method and exposing method and exposure apparatus using same
CANON KK15 citations74
US7760348B2Jul 20, 2010
Particle inspection apparatus, exposure apparatus, and device manufacturing method
CANON KK3 citations63
US7595861B2Sep 29, 2009
Exposure apparatus and method of manufacturing device
CANON KK0 citations52
US10067427B2Sep 4, 2018
Holding device, holding method, lithography apparatus, and article manufacturing method
CANON KK0 citations42
US7936452B2May 3, 2011
Inspection apparatus, exposure apparatus, and method of manufacturing device
CANON KK0 citations42
US9575413B2Feb 21, 2017
Exposure apparatus, exposure method, and device manufacturing method
CANON KK0 citations36
NIKON CORP
4 patentsKYODO NEWS SERVICE
2 patentsOPPAMA KOGYO KK
2 patentsKAWAHARA ATSUSHI
2 patentsUNIV OSAKA PUBLIC CORP
2 patentsUS12343818B2Jul 1, 2025
Method and apparatus for analyzing additively manufactured object, and method and apparatus for additively manufacturing an object
UNIV OSAKA PUBLIC CORP0 citations40
US11898923B2Feb 13, 2024
Measuring method of residual stress distribution, calculating method of same, and program
UNIV OSAKA PUBLIC CORP0 citations38