Inventor
POSTOLOV YURI
IL5 patents
Patents
5 patentsUS8238645B2Aug 7, 2012
Inspection system and a method for detecting defects based upon a reference frame
POSTOLOV YURI2 citations57
US8233699B2Jul 31, 2012
Inspection system and a method for detecting defects based upon a reference frame
POSTOLOV YURI1 citations57
US10203289B2Feb 12, 2019
Inspection system and a method for inspecting a diced wafer
POSTOLOV YURI0 citations46
US10042974B2Aug 7, 2018
Inspecting a wafer using image and design information
POSTOLOV YURI0 citations36
US8208713B2Jun 26, 2012
Method and system for inspecting a diced wafer
POSTOLOV YURI0 citations36