Inventor
LEVY SAGY
IL44 patents
⚠️ This page may combine multiple inventors who share the name “LEVY SAGY”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
POLISHCHUK IGOR
7 patentsUS8063434B1Nov 22, 2011
Memory transistor with multiple charge storing layers and a high work function gate electrode
POLISHCHUK IGOR93 citations98
US8633537B2Jan 21, 2014
Memory transistor with multiple charge storing layers and a high work function gate electrode
POLISHCHUK IGOR23 citations96
US8860122B1Oct 14, 2014
Nonvolatile charge trap memory device having a high dielectric constant blocking region
POLISHCHUK IGOR30 citations92
US8859374B1Oct 14, 2014
Memory transistor with multiple charge storing layers and a high work function gate electrode
POLISHCHUK IGOR19 citations92
US8592891B1Nov 26, 2013
Methods for fabricating semiconductor memory with process induced strain
POLISHCHUK IGOR19 citations92
US9431549B2Aug 30, 2016
Nonvolatile charge trap memory device having a high dielectric constant blocking region
POLISHCHUK IGOR7 citations84
US8691648B1Apr 8, 2014
Methods for fabricating semiconductor memory with process induced strain
POLISHCHUK IGOR2 citations63
RAMKUMAR KRISHNASWAMY
6 patentsUS8318608B2Nov 27, 2012
Method of fabricating a nonvolatile charge trap memory device
RAMKUMAR KRISHNASWAMY46 citations97
US8940645B2Jan 27, 2015
Radical oxidation process for fabricating a nonvolatile charge trap memory device
RAMKUMAR KRISHNASWAMY33 citations93
US8993453B1Mar 31, 2015
Method of fabricating a nonvolatile charge trap memory device
RAMKUMAR KRISHNASWAMY17 citations92
US8679927B2Mar 25, 2014
Integration of non-volatile charge trap memory devices and logic CMOS devices
RAMKUMAR KRISHNASWAMY31 citations92
US8871595B2Oct 28, 2014
Integration of non-volatile charge trap memory devices and logic CMOS devices
RAMKUMAR KRISHNASWAMY13 citations84
US8088683B2Jan 3, 2012
Sequential deposition and anneal of a dielectic layer in a charge trapping memory device
RAMKUMAR KRISHNASWAMY3 citations63
LEVY SAGY
6 patentsUS9449831B2Sep 20, 2016
Oxide-nitride-oxide stack having multiple oxynitride layers
LEVY SAGY22 citations92
US8643124B2Feb 4, 2014
Oxide-nitride-oxide stack having multiple oxynitride layers
LEVY SAGY27 citations92
US8067284B1Nov 29, 2011
Oxynitride bilayer formed using a precursor inducing a high charge trap density in a top layer of the bilayer
LEVY SAGY38 citations92
US9716153B2Jul 25, 2017
Nonvolatile charge trap memory device having a deuterated layer in a multi-layer charge-trapping region
LEVY SAGY3 citations72
US8637921B2Jan 28, 2014
Nitridation oxidation of tunneling layer for improved SONOS speed and retention
LEVY SAGY3 citations62
US8680601B2Mar 25, 2014
Nonvolatile charge trap memory device having a deuterated layer in a multi-layer charge-trapping region
LEVY SAGY0 citations52
CYPRESS SEMICONDUCTOR CORP
6 patentsUS7799670B2Sep 21, 2010
Plasma oxidation of a memory layer to form a blocking layer in non-volatile charge trap memory devices
CYPRESS SEMICONDUCTOR CORP24 citations92
US7898852B1Mar 1, 2011
Trapped-charge non-volatile memory with uniform multilevel programming
CYPRESS SEMICONDUCTOR CORP5 citations63
US7880219B2Feb 1, 2011
Nonvolatile charge trap memory device having <100> crystal plane channel orientation
CYPRESS SEMICONDUCTOR CORP2 citations63
US10263087B2Apr 16, 2019
Nonvolatile charge trap memory device having a deuterated layer in a multi-layer charge-trapping region
CYPRESS SEMICONDUCTOR CORP0 citations52
US9741803B2Aug 22, 2017
Nonvolatile charge trap memory device having a deuterated layer in a multi-layer charge-trapping region
CYPRESS SEMICONDUCTOR CORP0 citations52
US7446063B1Nov 4, 2008
Silicon nitride films
CYPRESS SEMICONDUCTOR CORP1 citations51
TOWER SEMICONDUCTOR LTD
6 patentsUS9484454B2Nov 1, 2016
Double-resurf LDMOS with drift and PSURF implants self-aligned to a stacked gate “bump” structure
TOWER SEMICONDUCTOR LTD11 citations80
US9105712B1Aug 11, 2015
Double RESURF LDMOS with separately patterned P+ and N+ buried layers formed by shared mask
TOWER SEMICONDUCTOR LTD10 citations79
US10217826B2Feb 26, 2019
Apparatus of a metal-oxide-semiconductor (MOS) transistor including a multi-split gate
TOWER SEMICONDUCTOR LTD1 citations60
US9837411B2Dec 5, 2017
Semiconductor die with a metal via
TOWER SEMICONDUCTOR LTD0 citations51
US9812566B1Nov 7, 2017
LDMOS device having a low angle sloped oxide
TOWER SEMICONDUCTOR LTD1 citations49
US9806174B2Oct 31, 2017
Double-resurf LDMOS with drift and PSURF implants self-aligned to a stacked gate “bump” structure
TOWER SEMICONDUCTOR LTD1 citations48
Longitude Flash Memory Solutions Ltd
3 patentsUS10374067B2Aug 6, 2019
Oxide-nitride-oxide stack having multiple oxynitride layers
Longitude Flash Memory Solutions Ltd3 citations84
US10903342B2Jan 26, 2021
Oxide-nitride-oxide stack having multiple oxynitride layers
Longitude Flash Memory Solutions Ltd1 citations73
US10896973B2Jan 19, 2021
Oxide-nitride-oxide stack having multiple oxynitride layers
Longitude Flash Memory Solutions Ltd1 citations73