Inventor

OKANO OSAMU

JP2 patents

⚠️ This page may combine multiple inventors who share the name “OKANO OSAMU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

FUJITSU MICROELECTRONICS LTD

1 patent

US7516376B2Apr 7, 2009

Test pattern generator, test circuit tester, test pattern generating method, test circuit testing method, and computer product

FUJITSU MICROELECTRONICS LTD10 citations79

FUJITSU LTD

1 patent

US7315997B2Jan 1, 2008

Method and apparatus for supporting designing of LSI, and computer product

FUJITSU LTD2 citations56