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Inventor
BHATTAGIRI RAGHUNATH R
IN
2 patents
Patents
2 patents
US7750660B2
Jul 6, 2010
Integrated circuit with improved test capability via reduced pin count
QUALCOMM INC
6 citations
68
US7932736B2
Apr 26, 2011
Integrated circuit with improved test capability via reduced pin count
QUALCOMM INC
1 citations
47