Inventor · disambiguated record

Heiner Jaksch

Also filed as: JAKSCH HEINER

1 granted patent·1 pending application·4 citations·filing 2006–2012

25Inventor score

Technology areasH01J

Files withJAKSCH HEINER1 ZEISS CARL NTS GMBH1

Top patents by PatentIndex Score

2 records

0169US7285780B2Detector system for a scanning electron microscope and a scanning electron microscope incorporating said detector systemZEISS CARL NTS GMBH·Filed 2006·Granted Oct 23, 2007·4 cites·31 claims
0222US2013082175A1Method and particle beam device for producing an image of an objectJAKSCH HEINER·Filed 2012·Application pending·0 cites

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →