Inventor
KUBOTA HITOSHI
JP111 patents
⚠️ This page may combine multiple inventors who share the name “KUBOTA HITOSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
20 patentsUS6329826B1Dec 11, 2001
Method and apparatus for inspecting integrated circuit pattern
HITACHI LTD95 citations99
US6172363B1Jan 9, 2001
Method and apparatus for inspecting integrated circuit pattern
HITACHI LTD185 citations99
US5774222AJun 30, 1998
Manufacturing method of semiconductor substrative and method and apparatus for inspecting defects of patterns on an object to be inspected
HITACHI LTD167 citations99
US6404498B1Jun 11, 2002
Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns on an object to be inspected
HITACHI LTD38 citations96
US6263099B1Jul 17, 2001
Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected
HITACHI LTD56 citations96
US5649022AJul 15, 1997
Pattern checking method and checking apparatus
HITACHI LTD79 citations96
US5430548AJul 4, 1995
Method and apparatus for pattern detection
HITACHI LTD70 citations96
US5309108AMay 3, 1994
Method of inspecting thin film transistor liquid crystal substrate and apparatus therefor
HITACHI LTD89 citations96
US5293538AMar 8, 1994
Method and apparatus for the inspection of defects
HITACHI LTD80 citations96
US5153444AOct 6, 1992
Method and apparatus for detecting patterns
HITACHI LTD92 citations96
US4791586ADec 13, 1988
Method of and apparatus for checking geometry of multi-layer patterns for IC structures
HITACHI LTD99 citations96
US4725722AFeb 16, 1988
Automatic focusing method and apparatus utilizing contrasts of projected pattern
HITACHI LTD57 citations96
US7417444B2Aug 26, 2008
Method and apparatus for inspecting integrated circuit pattern
HITACHI LTD25 citations92
US7026830B2Apr 11, 2006
Method and apparatus for inspecting integrated circuit pattern
HITACHI LTD19 citations92
US6559663B2May 6, 2003
Method and apparatus for inspecting integrated circuit pattern
HITACHI LTD20 citations92
US5229607AJul 20, 1993
Combination apparatus having a scanning electron microscope therein
HITACHI LTD47 citations92
US4814615AMar 21, 1989
Method and apparatus for detecting defect in circuit pattern of a mask for X-ray exposure
HITACHI LTD31 citations92
US7952074B2May 31, 2011
Method and apparatus for inspecting integrated circuit pattern
HITACHI LTD8 citations84
US6317512B1Nov 13, 2001
Pattern checking method and checking apparatus
HITACHI LTD16 citations84
US5157735AOct 20, 1992
Chipping detection system and method
HITACHI LTD12 citations74
NISSAN MOTOR
6 patentsUS4717207AJan 5, 1988
Booster unit for moving a vehicle on a slope and method of controlling the same
NISSAN MOTOR85 citations95
US4633757AJan 6, 1987
Brake booster
NISSAN MOTOR29 citations93
US4355512AOct 26, 1982
Reservoir for use with tandem master cylinder
NISSAN MOTOR35 citations92
US4385495AMay 31, 1983
Fluid reservoir for tandem master cylinder
NISSAN MOTOR20 citations82
US4356729ANov 2, 1982
Fluid level detector
NISSAN MOTOR24 citations82
US4500761AFeb 19, 1985
Fluid reservoir with fluid-level sensor
NISSAN MOTOR25 citations78
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD
4 patentsUS5280436AJan 18, 1994
Method for measuring three-dimensional position of object to be captured and method for capturing the object
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD40 citations92
US5198876AMar 30, 1993
Method of measuring three-dimensional postion of workpiece
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD21 citations92
US4764883AAug 16, 1988
Industrial robot having selective teaching modes
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD25 citations92
US6941200B2Sep 6, 2005
Automated guided vehicle, operation control system and method for the same, and automotive vehicle
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD36 citations86
RENESAS TECH CORP
2 patentsUS7061600B2Jun 13, 2006
Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns on an object to be inspected
RENESAS TECH CORP11 citations93
US7180584B2Feb 20, 2007
Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected
RENESAS TECH CORP5 citations74
KAI TADASHI
2 patentsTOSHIBA KK
2 patentsNEC CORP
1 patentUNISIA JECS CORP
1 patentHITACHI HIGH TECH CORP
1 patentNAT INST OF ADVANCED IND SCIEN
1 patentTANABE SEIYAKU CO
1 patentDAIBOU TADAOMI
1 patentSONY CORP
1 patentMITSUBISHI ELECTRIC CORP
1 patentMITSUBISHI TANABE PHARMA CORP
1 patentROHM CO LTD
1 patentCANON ANELVA CORP
1 patentFUKUSHIMA AKIO
1 patentOKAMOTO MASAKI
1 patentKUBOTA HITOSHI
1 patentShowing the top 50 of 111 patents by PatentIndex Score.