Inventor
SALEM GERARD M
US26 patents
⚠️ This page may combine multiple inventors who share the name “SALEM GERARD M”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
22 patentsUS6643807B1Nov 4, 2003
Array-built-in-self-test (ABIST) for efficient, fast, bitmapping of large embedded arrays in manufacturing test
IBM89 citations96
US5664223ASep 2, 1997
System for independently transferring data using two independently controlled DMA engines coupled between a FIFO buffer and two separate buses respectively
IBM71 citations93
US5844917ADec 1, 1998
Method for testing adapter card ASIC using reconfigurable logic
IBM39 citations92
US5841790ANov 24, 1998
Apparatus for testing an adapter card ASIC with reconfigurable logic
IBM26 citations92
US7308621B2Dec 11, 2007
Testing of ECC memories
IBM28 citations91
US7042776B2May 9, 2006
Method and circuit for dynamic read margin control of a memory array
IBM28 citations91
US5544088AAug 6, 1996
Method of I/O pin assignment in a hierarchial packaging system
IBM28 citations85
US7194715B2Mar 20, 2007
Method and system for performing static timing analysis on digital electronic circuits
IBM14 citations82
US10209306B2Feb 19, 2019
Methods and systems for generating functional test patterns for manufacture test
IBM1 citations73
US9857422B2Jan 2, 2018
Methods and systems for generating functional test patterns for manufacture test
IBM2 citations73
US10365132B2Jul 30, 2019
Methods and systems for performing test and calibration of integrated sensors
IBM2 citations72
US10247776B2Apr 2, 2019
Structurally assisted functional test and diagnostics for integrated circuits
IBM1 citations62
US7149941B2Dec 12, 2006
Optimized ECC/redundancy fault recovery
IBM3 citations61
US6989696B2Jan 24, 2006
System and method for synchronizing divide-by counters
IBM3 citations61
US10585142B2Mar 10, 2020
Functional diagnostics based on dynamic selection of alternate clocking
IBM0 citations52
US10545188B2Jan 28, 2020
Functional diagnostics based on dynamic selection of alternate clocking
IBM0 citations52
US10203371B2Feb 12, 2019
Methods and systems for generating functional test patterns for manufacture test
IBM0 citations52
US10598526B2Mar 24, 2020
Methods and systems for performing test and calibration of integrated sensors
IBM0 citations51
US9733307B1Aug 15, 2017
Optimized chain diagnostic fail isolation
IBM1 citations51
US8984335B2Mar 17, 2015
Core diagnostics and repair
IBM1 citations49
US10613142B2Apr 7, 2020
Non-destructive recirculation test support for integrated circuits
IBM0 citations42
US10571519B2Feb 25, 2020
Performing system functional test on a chip having partial-good portions
IBM0 citations40