Inventor

SEARS CHRISTOPHER

US39 patents

⚠️ This page may combine multiple inventors who share the name “SEARS CHRISTOPHER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SEARS CHRISTOPHER

KLA TENCOR CORP

Inspection site preparation

Position feedback for multi-beam particle detector

Particle beam inspector with independently-controllable beams

Electron beam apparatus with high resolutions

Deflection array apparatus for multi-electron beam system

Method and system for aberration correction in an electron beam system

High resolution electron energy analyzer

Apparatus and method for optical inspection, magnetic field and height mapping

Method and system for edge-of-wafer inspection and review

Multi-column scanning electron microscopy system

Extractor electrode for electron source

Charge control device for a system with multiple electron beams

Magnetically microfocused electron emission source

Asymmetric electrostatic quadrupole deflector for improved field uniformity

Space charge insensitive electron gun designs

Field curvature correction for multi-beam inspection systems

Heat-spreading blanking system for high throughput electron beam apparatus

Method and system for edge-of-wafer inspection and review

Wafer grounding using localized plasma source

System and method for drift compensation on an electron beam based characterization tool

Method and system for charge control for imaging floating metal structures on non-conducting substrates

Method and system for aberration correction in an electron beam system

Method and system for reducing charging artifacts in scanning electron microscopy images

Scanning electron microscope objective lens calibration using X-Y voltages iteratively determined from images obtained using said voltages

KLA CORP

Electron beam system for inspection and review of 3D devices

Micro stigmator array for multi electron beam system

Detection and correction of system responses in real-time

High resolution electron beam apparatus with dual-aperture schemes

Electron source with magnetic suppressor electrode

Method and system of image-forming multi-electron beams

Detection and correction of system responses in real-time

Systems and methods of creating multiple electron beams

Joint electron-optical columns for flood-charging and image-forming in voltage contrast wafer inspections

CHOPRA SHELESH

Automated hotfix handling model

SEARS CHRISTOPHER

Permanent magnet lens array

NASSER-GHODSI MEHRAN

Background reduction system including louver

SHADMAN KHASHAYAR

Charged-particle energy analyzer

TARVEDA THERAPEUTICS INC

SSTR-targeted conjugates and particles and formulations thereof

NEIL MARK

Auger elemental identification algorithm