P

Inventor

KOH CHA WON

KR55 patents
⚠️ This page may combine multiple inventors who share the name “KOH CHA WON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

23 patents
US9520289B2Dec 13, 2016

Methods of forming a pattern of a semiconductor device

SAMSUNG ELECTRONICS CO LTD374 citations99
US9772555B2Sep 26, 2017

Methods of forming patterns using photoresists

SAMSUNG ELECTRONICS CO LTD52 citations93
US8003543B2Aug 23, 2011

Method of forming a hard mask and method of forming a fine pattern of semiconductor device using the same

SAMSUNG ELECTRONICS CO LTD21 citations92
US7732341B2Jun 8, 2010

Method of forming a hard mask and method of forming a fine pattern of semiconductor device using the same

SAMSUNG ELECTRONICS CO LTD18 citations92
US7540970B2Jun 2, 2009

Methods of fabricating a semiconductor device

SAMSUNG ELECTRONICS CO LTD27 citations92
US7892982B2Feb 22, 2011

Method for forming fine patterns of a semiconductor device using a double patterning process

SAMSUNG ELECTRONICS CO LTD19 citations84
US7560768B2Jul 14, 2009

Nonvolatile memory device and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD8 citations84
US10797056B2Oct 6, 2020

Semiconductor device and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD7 citations83
US7687369B2Mar 30, 2010

Method of forming fine metal patterns for a semiconductor device using a damascene process

SAMSUNG ELECTRONICS CO LTD7 citations74
US10586798B2Mar 10, 2020

Semiconductor device and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD4 citations72
US9482953B2Nov 1, 2016

Lithography apparatus having effective thermal electron enhancement unit and method of forming pattern using the same

SAMSUNG ELECTRONICS CO LTD2 citations63
US7998874B2Aug 16, 2011

Method for forming hard mask patterns having a fine pitch and method for forming a semiconductor device using the same

SAMSUNG ELECTRONICS CO LTD5 citations63
US7862988B2Jan 4, 2011

Method for forming patterns of semiconductor device

SAMSUNG ELECTRONICS CO LTD6 citations63
US12372885B2Jul 29, 2025

Substrate processing apparatus and method of fabricating semiconductor device using the same

SAMSUNG ELECTRONICS CO LTD0 citations62
US11927890B1Mar 12, 2024

Substrate processing apparatus and method of fabricating semiconductor device using the same

SAMSUNG ELECTRONICS CO LTD0 citations62
US7787301B2Aug 31, 2010

Flash memory device using double patterning technology and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD4 citations62
US7678650B2Mar 16, 2010

Nonvolatile memory device and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD3 citations62
US7582899B2Sep 1, 2009

Semiconductor device having overlay measurement mark and method of fabricating the same

SAMSUNG ELECTRONICS CO LTD3 citations62
US7452825B2Nov 18, 2008

Method of forming a mask structure and method of forming a minute pattern using the same

SAMSUNG ELECTRONICS CO LTD5 citations62
US7387869B2Jun 17, 2008

Method of forming pattern for semiconductor device

SAMSUNG ELECTRONICS CO LTD1 citations52
US9412604B2Aug 9, 2016

Methods of manufacturing semiconductor device

SAMSUNG ELECTRONICS CO LTD0 citations51
US7842451B2Nov 30, 2010

Method of forming pattern

SAMSUNG ELECTRONICS CO LTD0 citations50
US7575855B2Aug 18, 2009

Method of forming pattern

SAMSUNG ELECTRONICS CO LTD0 citations50

HYUNDAI ELECTRONICS IND

15 patents
US6599844B2Jul 29, 2003

Method and forming fine patterns of semiconductor devices using passivation layers

HYUNDAI ELECTRONICS IND40 citations93
US6410670B1Jun 25, 2002

Photoresist monomer having hydroxy group and carboxy group, copolymer thereof and photoresist composition using the same

HYUNDAI ELECTRONICS IND16 citations93
US6235447B1May 22, 2001

Photoresist monomers, polymers thereof, and photoresist compositions containing the same

HYUNDAI ELECTRONICS IND38 citations93
US6764806B2Jul 20, 2004

Over-coating composition for photoresist, and processes for forming photoresist patterns using the same

HYUNDAI ELECTRONICS IND17 citations84
US6627378B1Sep 30, 2003

Photoresist composition for top-surface imaging process by silylation

HYUNDAI ELECTRONICS IND6 citations74
US6399272B1Jun 4, 2002

Phenylenediamine derivative-type additive useful for a chemically amplified photoresist

HYUNDAI ELECTRONICS IND11 citations74
US6387589B1May 14, 2002

Photoresist polymers and photoresist compositions containing the same

HYUNDAI ELECTRONICS IND11 citations74
US6368771B1Apr 9, 2002

Photoresist polymers and photoresist compositions containing the same

HYUNDAI ELECTRONICS IND9 citations74
US6348296B1Feb 19, 2002

Copolymer resin, preparation thereof, and photoresist using the same

HYUNDAI ELECTRONICS IND9 citations74
US6200731B1Mar 13, 2001

Photoresist cross-linking monomers, photoresist polymers and photoresist compositions comprising the same

HYUNDAI ELECTRONICS IND11 citations74
US5888698AMar 30, 1999

Photoresist film for deep ultra violet and method for forming photoresist film pattern using the same

HYUNDAI ELECTRONICS IND9 citations74
US6699644B1Mar 2, 2004

Process for forming a photoresist pattern comprising alkaline treatment

HYUNDAI ELECTRONICS IND4 citations63
US6017676AJan 25, 2000

Photoresist composition comprising a copolymer resin

HYUNDAI ELECTRONICS IND6 citations63
US6586619B2Jul 1, 2003

Photoresist monomer having hydroxy group and carboxy group, copolymer thereof and photoresist composition using the same

HYUNDAI ELECTRONICS IND1 citations52
US6087065AJul 11, 2000

Photoresist film for deep ultra violet and method for forming photoresist film pattern using the same

HYUNDAI ELECTRONICS IND1 citations52

HYNIX SEMICONDUCTOR INC

7 patents

KOH CHA-WON

3 patents

PARK JIN

2 patents

Showing the top 50 of 55 patents by PatentIndex Score.